SN74ABT8646 Datasheet

SN74ABT8646 SCAN TEST DEVICES

The ’ABT8646 and scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan acce.

Features

nd scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. A2 A3 GND A4 A5 A6 A7 SN54ABT8646 . . . JT PACKAGE SN74ABT8646 . . . DL OR DW PACKAGE (TOP VIEW) CLKAB 1 SAB 2 DIR 3 A1 4 A2 5 A3 6 GND 7 A4 8 A5 9 A6 10 A7 11 A8 12 TDO 13 TMS 14 28 CLKBA 27 SBA 26 OE 25 B1 24 B2 23 B3 .