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SCAN921025H


Part Number SCAN921025H
Manufacturer National Semiconductor
Title High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes
Description The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. ...
Features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserial...

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SCAN921025 : The SCAN921025 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be v.

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SCAN921025H : .

SCAN921025H : The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be.

SCAN921025SLC : The SCAN921025 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be v.




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