DIODES. 1N5250B Datasheet

1N5250B Datasheet PDF


Part 1N5250B
Description ZENER DIODES
Feature AiT Components Inc. www.ait-components.com 1N5221B~1N5272B ZENER DIODES 500mW 1N52 SERIES DESCRIPT.
Manufacture AiT Components
Datasheet
Download 1N5250B Datasheet


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Zener Diode Features: • High reliability. • Very sharp reve 1N5250B Datasheet
NOT RECOMMENDED FOR NEW DESIGN, USE MMSZ52xxB 1N5221B - 1N5 1N5250B Datasheet
Features Silicon planar power zener diodes Standard Zener vo 1N5250B Datasheet




1N5250B
AiT Components Inc.
www.ait-components.com
1N5221B~1N5272B
ZENER DIODES
500mW 1N52 SERIES
DESCRIPTION
The 1N5221B~1N5272B are available in DO-35
Package
PIN DESCRIPTION
FEATURES
500mW DO-35
Zener voltage regulator diodes
Hermetically sealed glass silicon zener diodes
Complete voltage range_2.4 to 43 volts
RoHS Compliant
Available in DO-35 Package
ORDERING INFORMATION
Package Type
DO-35
Part Number
1N5221B
1N5222B
1N5223B
1N5224B
1N5225B
1N5226B
1N5227B
1N5228B
1N5229B
1N5230B
1N5231B
1N5232B
1N5233B
1N5234B
1N5235B
1N5236B
1N5237B
1N5238B
1N5239B
1N5240B
1N5241B
1N5242B
1N5243B
1N5244B
1N5245B
1N5246B
1N5247B
Package Type
Part Number
1N5248B
1N5249B
1N5250B
1N5251B
1N5252B
1N5253B
1N5254B
1N5255B
1N5256B
1N5257B
1N5258B
1N5259B
DO-35
1N5260B
1N5261B
1N5262B
1N5263B
1N5264B
1N5265B
1N5266B
1N5267B
1N5268B
1N5269B
1N5270B
1N5271B
1N5272B
Note
5,000pcs/Tape
AiT provides all RoHS Compliant Products
REV1.1
- APR 2012 RELEASED, SEP 2012 UPDATED -
-1-



1N5250B
AiT Components Inc.
www.ait-components.com
1N5221B~1N5272B
ZENER DIODES
500mW 1N52 SERIES
ABSOLUTE MAXIMUM RATINGS
TJ=25
PV, Power dissipation(Tamb50)
0.5W
TJ, Junction temperature
175
TSTG, Storage temperature range
-65 ~ +175
VF, Forward voltage(IF=200mA)
<1.1V
Stresses above may cause permanent damage to the device. These are stress ratings only and functional operation of the device at
these or any other conditions beyond those indicated in the Electrical Characteristics are not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
REV1.1
- APR 2012 RELEASED, SEP 2012 UPDATED -
-2-






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