74AHCT30-Q100

74AHC30-Q100; 74AHCT30-Q100 8-input NAND gate Rev. 2 — 6 May 2020 Product data sheet 1. General description The 74AHC30-Q100; 74AHCT30-Q100 is a high-speed Si-gate CMOS device and is pin compatible with Low-power Schottky TTL (LSTTL). It is specified in compliance with JEDEC standard No. 7-A. The 74AHC30-Q100; 74AHCT30-Q100 provides an 8-input NAND function. This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications. 2. Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from -40 °C to +85 °C and from -40 °C to +125 °C Balanced propagation delays All inputs have Schmitt-trigger actions Inputs accept voltages higher than VCC Input levels: For 74AHC30-Q100: CMOS level For 74AHCT30-Q100: TTL level ESD protection: MIL-STD-883, method 3015 exceeds 2000 V HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω) Multiple package options DHVQFN package with Side-Wettable Flanks enabling Automatic Optical Inspection (AOI) of solder joints 3. Ordering information Table 1. Ordering information Type number Package Temperature range 74AHC30D-Q100 -40 °C to +125 °C 74AHCT30D-Q100 74AHC30PW-Q100 -40 °C to +125 °C 74AHCT30PW-Q100 74AHC30BQ-Q100 -40 °C to +125 °C 74AHCT30BQ-Q100 Name Description Version SO14 plastic small outline package; 14 leads; body width 3.9 mm SOT108-1 ...