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ACS03MS Datasheet

Part Number ACS03MS
Manufacturers Intersil Corporation
Logo Intersil Corporation
Description Radiation Hardened Quad 2-Input NAND Gate
Datasheet ACS03MS DatasheetACS03MS Datasheet (PDF)

ACS03MS January 1996 Radiation Hardened Quad 2-Input NAND Gate with Open Drain Features Pinouts • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96703 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si) • Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) • SEU LET Threshold . . . . . . . ..

  ACS03MS   ACS03MS






Radiation Hardened Quad 2-Input NAND Gate

ACS03MS January 1996 Radiation Hardened Quad 2-Input NAND Gate with Open Drain Features Pinouts • Devices QML Qualified in Accordance with MIL-PRF-38535 • Detailed Electrical and Screening Requirements are Contained in SMD# 5962-96703 and Intersil’s QM Plan • 1.25 Micron Radiation Hardened SOS CMOS • Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si) • Single Event Upset (SEU) Immunity: <1 x 10-10 Errors/Bit/Day (Typ) • SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm2/mg • Dose Rate Upset . . . . . . . . . . . . . . . . >1011 RAD (Si)/s, 20ns Pulse • Dose Rate Survivability . . . . . . . . . . . >1012 RAD (Si)/s, 20ns Pulse • Latch-Up Free Under Any Conditions • Military Temperature Range . . . . . . . . . . . . . . . . . . -55oC to +125oC 14 PIN CERAMIC DUAL-IN-LINE MIL-STD-1835 DESIGNATOR CDIP2-T14, LEAD FINISH C TOP VIEW A1 1 B1 2 Y1 3 A2 4 B2 5 Y2 6 GND 7 14 VCC 13 B4 12 A4 11 Y4 10 B3.


2005-03-23 : 2N2857CSM    2N2880    2N2891    2N2894    2N2894    2N2894    2N2894A    2N2894ACSM    2N2894CSM    2N2894DCSM   


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