CGHV27100
100 W, 2500-2700 MHz, 50 V, GaN HEMT for LTE
Cree’s CGHV27100 is a gallium nitride (GaN) high electron mobility transistor (HEMT) is designed specifically for high efficiency, high gain and wide bandwidth capabilities, which makes the CGHV27100 ideal for 2.5 - 2.7 GHz LTE, 4G Telecom and BWA amplifier applications. The transistor is input matched and supplied in a ceramic/ metal pill and flange packages.
PNPa: CckGaHgVe2T7y1p0e0: F44a0n1d6C2GaHndV2474100106P1
Typical Performanc.
GaN HEMT
CGHV27100
100 W, 2500-2700 MHz, 50 V, GaN HEMT for LTE
Cree’s CGHV27100 is a gallium nitride (GaN) high electron mobility transistor (HEMT) is designed specifically for high efficiency, high gain and wide bandwidth capabilities, which makes the CGHV27100 ideal for 2.5 - 2.7 GHz LTE, 4G Telecom and BWA amplifier applications. The transistor is input matched and supplied in a ceramic/ metal pill and flange packages.
PNPa: CckGaHgVe2T7y1p0e0: F44a0n1d6C2GaHndV2474100106P1
Typical Performance Over 2.5 - 2.7 GHz (TC = 25˚C) of Demonstration Amplifier
Parameter
2.5 GHz
2.6 GHz
2.7 GHz
Gain @ 44 dBm
18.1
18.0
17.9
ACLR @ 44 dBm
-37.0
-37.0
-37.0
Drain Efficiency @ 44 dBm
34.0
33.5
32.0
Note: Measured in the CGHV27100-AMP amplifier circuit, under WCDMA 3GPP test model 1, 64 DPCH, 45% clipping, PAR = 7.5 dB @ 0.01% Probability on CCDF, VDD = 50 V, IDS = 500 mA.
Units dB dBc %
Features
• 2.5 - 2.7 GHz Operation • 18.0 dB Gain • -37 dBc ACLR at 25 W PAVE • 33 % Efficiency at 25 W PAVE • High Degree of DPD Correction Can be Applied
Rev 1.0 – May 2015
Subject to change without notice. www.cree.com/rf
1
Absolute Maximum Ratings (not simultaneous) at 25˚C Case Temperature
Parameter
Symbol
Drain-Source Voltage Gate-to-Source Voltage Storage Temperature Operating Junction Temperature Maximum Forward Gate Current Maximum Drain Current1 Soldering Temperature2 Screw Torque
VDSS VGS TSTG TJ IGMAX IDMAX TS
τ
Thermal Resistance, Junction to Case3 Thermal Res.