D78F0513

User’s Manual 78K0/KC2 8-bit Single-Chip Microcontrollers μPD78F0511 μPD78F0511(A) μPD78F0512 μPD78F0512(A) μPD78F0513 μPD78F0513(A) μPD78F0514 μPD78F0514(A) μPD78F0515 μPD78F0515(A) μPD78F0513D μPD78F0515D μPD78F0511(A2) μPD78F0512(A2) μPD78F0513(A2) μPD78F0514(A2) μPD78F0515(A2) The μPD78F0513D and 78F0515D have on-chip debug functions. Do not use these products for mass production because its reliability cannot be guaranteed after the on-chip debug function has been used, due to issues with respect to the number of times the flash memory can be rewritten. NEC Electronics does not accept complaints concerning these products. Document No. U17336EJ5V0UD00 (5th edition) Date Published February 2007 N CP(K) Pwriwntewd .inDJaatpaaSnheet4U.ne2t005 [MEMO] 2 User’s Manual U17336EJ5V0UD NOTES FOR CMOS DEVICES 1 VOLTAGE APPLICATION WAVEFORM AT INPUT PIN Waveform distortion due to input noise or a reflected wave may cause malfunction. If the input of the CMOS device stays in the area between VIL (MAX) and VIH (MIN) due to noise, etc., the device may malfunction. Take care to prevent chattering noise from entering the device when the input level is fixed, and also in the transition period when the input level passes through the area between VIL (MAX) and VIH (MIN). 2 HANDLING OF UNUSED INPUT PINS Unconnected CMOS device inputs can be cause of malfunction. If an input pin is unconnected, it is possible that an internal input level may be generated due to noise, etc., causing malf...