www.DataSheet4U.com
RF Power Field Effect Transistor LDMOS, 2110 — 2170 MHz, 90W, 28V
4/6/2005
Preliminary
MAPLST212...
www.DataSheet4U.com
RF Power Field Effect Transistor LDMOS, 2110 — 2170 MHz, 90W, 28V
4/6/2005
Preliminary
MAPLST2122-090CF
Features
Q
Package Style
Designed for W-CDMA base station applications in the 2.1 to 2.2 GHz Frequency Band. Suitable for TDMA, CDMA, W-CDMA and multicarrier power amplifier applications. 90W Output Power at P1dB (CW) 11dB Minimum Gain at P1dB (CW) W-CDMA Typical Performance: (28VDC, -45dB ACPR @ 4.096MHz) Q Output Power: 12W (typ.) Q Gain: 12dB (typ.) Q Efficiency: 16% (typ.) 10:1 VSWR Ruggedness (CW @ 60W, 28V, 2110MHz)
Q Q Q
MAPLST2122-090CF
Q
Maximum Ratings
Parameter Drain—Source
Voltage Gate—Source
Voltage Drain Current — Continuous Total Power Dissipation @ TC = 25 °C Storage Temperature Junction Temperature Symbol VDSS VGS ID PD TSTG TJ Rating 65 20 20 206 -40 to +150 +200 Units Vdc Vdc Adc W °C °C
Thermal Characteristics
Characteristic Thermal Resistance, Junction to Case Symbol RΘJC Max 0.85 Unit ºC/W
NOTE—CAUTION—MOS devices are susceptible to damage from electrostatic charge. Precautions in handling and packaging MOS devices should be observed.
RF Power LDMOS Transistor, 2110 — 2170 MHz, 90W, 28V
MAPLST2122-090CF
4/6/2005
Preliminary
Characteristic DC CHARACTERISTICS @ 25ºC Characteristic Drain-Source Breakdown
Voltage GS = 0 Vdc, ID = 100 µAdc) OFF(V CHARACTERISTICS Zero Gate
Voltage Drain Leakage Current 28 Vdc, VGS (VDS DS = 65 GS = 0) Gate—Source Leakage Zero Gate
Voltage DrainCurrent Leakage Current (VGS = = 26 5 Vdc, V 0...