N7788BD

Agilent N7788B/BD Optical Component Analyzer Data Sheet Figure 1. N7788BD bench-top mainframe with built-in PC Figure 2. N7788B bench-top mainframe Introduction Agilent Technologies pushes the limits of component measurements with the N7788B component analyzer. Its proprietary technology is comparable with the wellknown Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring polarization mode dispersion (PMD) or differential group delay (DGD) of optical devices. Compared to the JME, Agilent’s new single scan technology offers a range of advantages: A complete set of parameters: ● DGD/PMD ● PDL ● Power/loss ● TE/TM-loss www.DataSheet4U.com ● Jones matrices ● Mueller matrices ● 2nd-order PMD (depolarization + PCD) ● Principal states of polarization (PSPs) Key Benefits ● Highest accuracy in a single sweep: no averaging over multiple sweeps required ● High measurement speed: Complete measurement across C/L-band in less than 10 seconds (no need to wait for many averages) ● Robustness against fiber movement/ vibration and drift: Fixing fibers with sticky tape on the table or even operation on isolated optical table is not required! ● No limitation on optical path length of component ● The internal referencing scheme guarantees reliable and accurate measurements. Applications ● ● ● ● ● Fiber characterization: SMF, PMF, DCF Passive component testing: filters, isolators, circulators Dynamic component / module testing: OADM / ROADM Active component testing: EDFAs, ...