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SN54ABT18245 Datasheet

Part Number SN54ABT18245
Manufacturers Texas Instruments
Logo Texas Instruments
Description SCAN TEST DEVICE
Datasheet SN54ABT18245 DatasheetSN54ABT18245 Datasheet (PDF)

SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS SGBS307A – AUGUST 1994 – REVISED JANUARY 1995 • Member of the Texas Instruments SCOPE ™ Family of Testability Products • Member of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generatio.

  SN54ABT18245   SN54ABT18245






Part Number SN54ABT18245A
Manufacturers Texas Instruments
Logo Texas Instruments
Description SCAN TEST DEVICES
Datasheet SN54ABT18245 DatasheetSN54ABT18245A Datasheet (PDF)

SN54ABT18245A, SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random.

  SN54ABT18245   SN54ABT18245







SCAN TEST DEVICE

SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS SGBS307A – AUGUST 1994 – REVISED JANUARY 1995 • Member of the Texas Instruments SCOPE ™ Family of Testability Products • Member of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes • State-of-the-Art EPIC-ΙΙB™ BiCMOS Design Significantly Reduces Power Dissipation • Packaged in 380-mil Fine-Pitch Ceramic Flat Packages Using 25-mil Center-to-Center Spacings description The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54ABT18245 . . . WD PACKAGE (TOP VIEW) 1DIR 1B1 1B2 GND 1B3 1B4 VCC 1B5 1B6 1B7 GND 1B8 1B9 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7 VCC 2B8 2B9 GND 2DIR TDO TMS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 56 1OE 55 1A1 54 1A2 53 GND 52 1A3 51 1A4 50 VCC 49 1A5 48 1A6 47 1A7 46 GND 45 1.


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