SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Members of the Texas Instruments
Widebus™ Family
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs – Pseudo-Random.
SCAN TEST DEVICES
SN54ABT18245A, SN74ABT18245A
SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS
SCBS110H – AUGUST 1992 – REVISED FEBRUARY 1999
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Members of the Texas Instruments
Widebus™ Family
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation
From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Packaged in Plastic Shrink Small-Outline
(DL) and Thin Shrink Small-Outline (DGG) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Packages
description
The ’ABT18245A scan test devices with 18-bit bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
SN54ABT18245A . . . WD PACKAGE SN74ABT18245A . . . DGG OR DL PACKAGE
(TOP VIEW)
1DIR 1 1B1 2 1B2 3 GND 4 1B3 5 1B4 6 VCC 7 1B5 8 1B6 9 1B7 10 GND 11 1B8 12 1B9 13 2B1 14 2B2 15 2B3 16 2B4 17 GND 18 2B5 19 2B6 20 2B7 21 VCC 22 2B8 23 2B9 24 GND 25
2.