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SN74ABT18640 Datasheet

Part Number SN74ABT18640
Manufacturers Texas Instruments
Logo Texas Instruments
Description SCAN TEST DEVICE
Datasheet SN74ABT18640 DatasheetSN74ABT18640 Datasheet (PDF)

SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inpu.

  SN74ABT18640   SN74ABT18640






Part Number SN74ABT18646
Manufacturers Texas Instruments
Logo Texas Instruments
Description SCAN TEST DEVICE
Datasheet SN74ABT18640 DatasheetSN74ABT18646 Datasheet (PDF)

D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 D SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instruction.

  SN74ABT18640   SN74ABT18640







SCAN TEST DEVICE

SN54ABT18640, SN74ABT18640 SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS SCBS267C – FEBRUARY 1994 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design Significantly Reduces Power Dissipation D Packaged in Plastic Shrink Small-Outline (DL) and Thin Shrink Small-Outline (DGG) Packages and 380-mil Fine-Pitch Ceramic Flat (WD) Packages description The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54ABT18640 . . . WD PACKAGE SN74ABT18640 . . . DGG OR DL PACKAGE (TOP VIEW) 1DIR 1 1B1 2 1B2 3 GND 4 1B3 5 1B4 6 VCC 7 1B5 8 1B6 9 1B7 10 GND 11 1B8 12 1B9 13 2B1 14 2B2 15 2B3 16 2B4 17 GND 18 2B5 19 2B6 20 2B7 21 VCC.


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