SN74ABT18652

D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility SN74ABT18652 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS132B – AUGUST 1992 – REVISED JANUARY 2002 D SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ – Parallel Signature Analysis at Inputs With Masking Option – Pseudorandom Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes PM PACKAGE (TOP VIEW) 1A2 1A1 1OEBA GND 1SAB 1CLKAB TDO V CC TMS 1CLKBA 1SBA 1OEAB GND 1B1 1B2 1B3 1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 1 48 2 47 3 46 4 45 5 44 6 43 7 42 8 41 9 40 10 39 11 38 12 37 13 36 14 35 15 34 16 33 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 1B4 1B5 1B6 GND 1B7 1B8 1B9 VCC 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7 2A7 2A8 2A9 GND 2OEBA 2SAB 2CLKAB TDI VCC TCK 2CLKBA 2SBA GND 2OEAB 2B9 2B8 description This scan test device with an 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitat...