SN74ABT245B-EP

D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Typical VOLP (Output Ground Bounce) <1 V at VCC = 5 V, TA = 25°C D Ioff and Power-Up 3-State Support Hot Insertion † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SN74ABT245BĆEP OCTAL BUS TRANSCEIVER WITH 3ĆSTATE OUTPUTS SCBS798 - FEBRUARY 2004 D High-Drive Outputs (−24-mA IOH, 32-mA IOL) D Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD 17 D ESD Protection Exceeds JESD 22 − 2000-V Human-Body Model (A114-A) − 200-V Machine Model (A115-A) DB PACKAGE (TOP VIEW) DIR A1 A2 A3 A4 A5 A6 A7 A8 GND 1 2 3 4 5 6 7 8 9 10 20 VCC 19 OE 18 B1 17 B2 16 B3 15 B4 14 B5 13 B6 12 B7 11 B8 description/ordering information This octal bus transceiver is designed for asynchronous communication between data buses. The device transmits data from the A bus to the B bus or from the B bus to the A bus, depending...