SN74ABT541B-EP

D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D State-of-the-Art EPIC-ΙΙB BiCMOS Design Significantly Reduces Power Dissipation D Latch-Up Performance Exceeds 500 mA Per JEDEC Standard JESD-17 † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SN74ABT541BĆEP OCTAL BUFFER/DRIVER WITH 3ĆSTATE OUTPUTS SCBS797 − JANUARY 2004 D Typical VOLP (Output Ground Bounce) <1 V at VCC = 5 V, TA = 25°C D High-Impedance State During Power Up and Power Down D High-Drive Outputs (−32-mA IOH, 64-mA IOL) PW PACKAGE (TOP VIEW) OE1 1 A1 2 A2 3 A3 4 A4 5 A5 6 A6 7 A7 8 A8 9 GND 10 20 VCC 19 OE2 18 Y1 17 Y2 16 Y3 15 Y4 14 Y5 13 Y6 12 Y7 11 Y8 description/ordering information The SN74ABT541B octal buffer and line driver is ideal for driving bus lines or buffering memory address registers. The device features inputs and outputs on opposite sides of the package to facilitate printed circuit board layout. The 3-state control gate...