SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Functionally Equivalent to ’F543 and
’ABT543 in the Normal-Function Mode
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
– Parallel-.
SCAN TEST DEVICES
SN54ABT8543, SN74ABT8543
SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
SCBS120E – AUGUST 1991 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Functionally Equivalent to ’F543 and
’ABT543 in the Normal-Function Mode
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
– Parallel-Signature Analysis at Inputs With Masking Option
– Pseudo-Random Pattern Generation From Outputs
– Sample Inputs/Toggle Outputs – Binary Count From Outputs – Even-Parity Opcodes
D Two Boundary-Scan Cells Per I/O for
Greater Flexibility
D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design
Significantly Reduces Power Dissipation
D Package Options Include Plastic
Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT)
description
The ’ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
A2 A3 GND A4 A5 A6 A7
SN54ABT8543 . . . JT PACKAGE SN74ABT8543 . . . DL OR DW PACKAGE
(TOP VIEW)
LEAB 1 CEAB 2 OEAB 3
A1 4 A2 5 A3 .