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SN74ABT8543 Datasheet

Part Number SN74ABT8543
Manufacturers Texas Instruments
Logo Texas Instruments
Description SCAN TEST DEVICES
Datasheet SN74ABT8543 DatasheetSN74ABT8543 Datasheet (PDF)

SN54ABT8543, SN74ABT8543 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS SCBS120E – AUGUST 1991 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F543 and ’ABT543 in the Normal-Function Mode D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ – Parallel-.

  SN74ABT8543   SN74ABT8543






SCAN TEST DEVICES

SN54ABT8543, SN74ABT8543 SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS SCBS120E – AUGUST 1991 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F543 and ’ABT543 in the Normal-Function Mode D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ – Parallel-Signature Analysis at Inputs With Masking Option – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Even-Parity Opcodes D Two Boundary-Scan Cells Per I/O for Greater Flexibility D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design Significantly Reduces Power Dissipation D Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT) description The ’ABT8543 scan test devices with octal registered bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. A2 A3 GND A4 A5 A6 A7 SN54ABT8543 . . . JT PACKAGE SN74ABT8543 . . . DL OR DW PACKAGE (TOP VIEW) LEAB 1 CEAB 2 OEAB 3 A1 4 A2 5 A3 .


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