SN74ABT8646

SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 D Members of the Texas Instruments SCOPE  Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F646 and ’ABT646 in the Normal-Function Mode D SCOPE  Instruction Set − IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ − Parallel-Signature Analysis at Inputs With Masking Option − Pseudorandom Pattern Generation From Outputs − Sample Inputs/Toggle Outputs − Binary Count From Outputs − Even-Parity Opcodes D Two Boundary-Scan Cells Per I/O for Greater Flexibility D State-of-the-Art EPIC-ΙΙB BiCMOS Design Significantly Reduces Power Dissipation D Package Options Include Plastic Small-Outline (DW) and Shrink Small-Outline (DL) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT) description The ’ABT8646 and scan-test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. A2 A3 GND A4 A5 A6 A7 SN54ABT8646 . . . JT PACKAGE SN74ABT8646 . . . DL OR DW PACKAGE (TOP VIEW) CLKAB 1 SAB 2 DIR 3 A1 4...