SN74AC04-EP

SN74AC04ĆEP HEX INVERTER D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SCAS717 − OCTOBER 2003 D 2-V to 6-V VCC Operation D Inputs Accept Voltages to 6 V D Max tpd of 7 ns at 5 V D PACKAGE (TOP VIEW) 1A 1 1Y 2 2A 3 2Y 4 3A 5 3Y 6 GND 7 14 VCC 13 6A 12 6Y 11 5A 10 5Y 9 4A 8 4Y description/ordering information The SN74AC04 contains six independent inverters. The device performs the Boolean function Y = A. ORDERING INFORMATION TA PACKAGE‡ ORDERABLE PART NUMBER TOP-SIDE MARKING −55°C to 125°C SOIC − D Tape and reel SN74AC04MDREP SAC04MEP ‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each inverter) INPUT A OUTPUT Y H L L H logic diagram, each inverter (positive logic) A Y ...