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SN74BCT8373A TESTER Datasheet PDFSCAN TESTER SCAN TESTER |
| Part Number | SN74BCT8373A |
|---|---|
| Description | SCAN TESTER |
| Feature | SN54BCT8373A, SN74BCT8373A
SCAN TEST DEV ICES WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D O ctal Test-Integrated Circuits D Functio nally Equivalent to ’F373 and
’BCT3 73 in the Normal-Function Mode
D Compat ible With the IEEE Standard
1149. 1-1990 (JTAG) Test Access Port and Boundary-S can Architecture D Test Operation Synch ronous to Test Access Port (TAP) D Impl ement Optional Test Reset Signal by Rec ognizing a Double-High-Level Voltage (1 0 V ) on TMS Pin D SCOPE ™ Instructio n Set – IEEE Standard 1149 . |
| Manufacture | Texas Instruments |
| Datasheet |
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| Part Number | SN74BCT8373A |
|---|---|
| Description | SCAN TESTER |
| Feature | SN54BCT8373A, SN74BCT8373A
SCAN TEST DEV ICES WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D O ctal Test-Integrated Circuits D Functio nally Equivalent to ’F373 and
’BCT3 73 in the Normal-Function Mode
D Compat ible With the IEEE Standard
1149. 1-1990 (JTAG) Test Access Port and Boundary-S can Architecture D Test Operation Synch ronous to Test Access Port (TAP) D Impl ement Optional Test Reset Signal by Rec ognizing a Double-High-Level Voltage (1 0 V ) on TMS Pin D SCOPE ™ Instructio n Set – IEEE Standard 1149 . |
| Manufacture | Texas Instruments |
| Datasheet |
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