SN54BCT8373A, SN74BCT8373A
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SCBS044F – JUNE 1990 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Octal Test-Integrated Circuits D Functionally Equivalent to ’F373 and
’BCT373 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Acces...
