SN74HC166A-EP

SN74HC166AĆEP 8ĆBIT PARALLELĆLOAD SHIFT REGISTER SCLS559 − JANUARY 2004 D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Wide Operating Voltage Range of 2 V to 6 V D Outputs Can Drive Up To 10 LSTTL Loads D Low Power Consumption, 80-µA Max ICC D Typical tpd = 13 ns † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. D ±4-mA Output Drive at 5 V D Low Input Current of 1 µA Max D Synchronous Load D Direct Overriding Clear D Parallel-to-Serial Conversion D OR PW PACKAGE (TOP VIEW) SER A B C D CLK INH CLK GND 1 2 3 4 5 6 7 8 16 VCC 15 SH/LD 14 H 13 QH 12 G 11 F 10 E 9 CLR description/ordering information This parallel-in or serial-in, serial-out register features gated clock (CLK, CLK INH) inputs and an overriding clear (CLR) input. The parallel-in or serial-in modes are established by the shift/ load (SH/LD) input. When high, SH/LD enables the serial (SER) data input and couples the eight flip-flops for ...