SN74LVC02A-EP

www.ti.com FEATURES Controlled Baseline – One Assembly Site – One Test Site – One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree (1) Customer-Specific Configuration Control Can Be Supported Along With Major-Change Approval Inputs Accept Voltages to 5.5 V ESD Protection Exceeds JESD 22 (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SN74LVC02A-EP QUADRUPLE 2-INPUT POSITIVE-NOR GATE SCAS831 – MARCH 2007 – 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101) D OR PW PACKAGE (TOP VIEW) 1Y 1 1A 2 1B 3 2Y 4 2A 5 2B 6 GND 7 14 VCC 13 4Y 12 4B 11 4A 10 3Y 9 3B 8 3A DESCRIPTION/ORDERING INFORMATION The quadruple 2-input positive-NOR gate is designed for 2.7-V to 3.6-V VCC operation. The SN74LVC02A performs the Boolean function Y = A + B or Y = A B in positive logic. Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use ...