SN74LVC08A-EP

www.ti.com SN74LVC08A-EP QUADRUPLE 2-INPUT POSITIVE-AND GATE SCAS731D – NOVEMBER 2003 – REVISED SEPTEMBER 2007 FEATURES 1 Controlled Baseline – One Assembly – One Test Site – One Fabrication Site Extended Temperature Performance of –40°C to 125°C and –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) Operates From 1.65 V to 3.6 V Inputs Accept Voltages to 5.5 V Max tpd of 4.1 ns at 3.3 V Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C Typical VOHV (Output VOH Undershoot) >2 V at VCC = 3.3 V, TA = 25°C D OR PW PACKAGE (TOP VIEW) 1A 1 1B 2 1Y 3 2A 4 2B 5 2Y 6 GND 7 14 VCC 13 4B 12 4A 11 4Y 10 3B 9 3A 8 3Y DESCRIPTION/ORDERING INFORMATION The SN74LVC08A quadruple 2-input positive-AND gate is designed for 2.7-V to 3.6-V VCC operation. The device performs the Boolean ...