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FEATURES
• Controlled Baseline – One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performa...
www.ti.com
FEATURES
Controlled Baseline – One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification Qualification Pedigree (1) Supports 5-V VCC Operation Input and Open-Drain Output Accept
Voltages up to 5.5 V
Max tpd of 5.7 ns at 3.3 V
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SN74LVC1G07-EP SINGLE BUFFER/DRIVER WITH OPEN-DRAIN OUTPUT
SCES685 – JULY 2007
Low Power Consumption, 10-μA Max ICC ±24-mA Output Drive at 3.3 V Ioff Supports Partial-Power-Down Mode
Operation Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A) – 200-V Machine Model (A115-A) – 1000-V Charged-Device Model (C101)
DCK PACKAGE (TOP VIEW)
NC
1
5
VCC
A
2
GND
3
4Y
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This single buffer/driver is designed for 1.65-V to 5.5-V VCC operation.
The output of the SN74LVC1G...