SN74LVC2G02-EP

www.ti.com SN74LVC2G02-EP DUAL 2-INPUT POSITIVE-NOR GATE SGDS034A – SEPTEMBER 2007 – REVISED SEPTEMBER 2007 FEATURES 1 Controlled Baseline – One Assembly Site – One Test Site – One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product Change Notification Qualification Pedigree (1) Supports 5-V VCC Operation Inputs Accept Voltages to 5.5 V Max tpd of 5.9 ns at 3.3 V Low Power Consumption, 10 μA Max ICC (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. ±24 mA Output Drive at 3.3 V Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C Typical VOHV (Output VOH Undershoot) >2 V at VCC = 3.3 V, TA = 25°C Ioff Supports Partial-Power-Down Mode Operation Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 1000-V Charged-Device Model (C101) DCU PACKAGE (TOP VIEW) 1A 1B 2Y GND 1 2 3 4 8 7 6 5 VCC 1Y 2B 2A See mechanical drawings for dimensions. ...