SN74LVC2G17-EP

www.ti.com FEATURES Controlled Baseline – One Assembly/Test Site, One Fabrication Site Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree (1) Customer-Specific Configuration Control Can Be Supported Along With Major-Change Approval Supports 5-V VCC Operation Inputs Accept Voltages to 5.5 V Max tpd of 5.4 ns at 3.3 V Low Power Consumption, 10-µA Max ICC ±24-mA Output Drive at 3.3 V Typical VOLP (Output Ground Bounce) <0.8 V at VCC = 3.3 V, TA = 25°C (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SN74LVC2G17-EP DUAL SCHMITT-TRIGGER BUFFER SCES683 – JANUARY 2007 Typical VOHV (Output VOH Undershoot) >2 V at VCC = 3.3 V, TA = 25°C Ioff Supports Partial-Power-Down Mode Operation Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II ESD Protection Exceeds JESD 22 – 2000-V Human-Body Model (A114-A) – 1000-V Charged-Device Model (C101) DCK PACKAGE (TOP VIEW) 1A 1 6 1Y GND 2 5 VCC 2A 3 4 2Y DESCRIPTION/ORDERING INFORMATION This dual Schmitt-trigger buffe...