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TLV2773-EP

Texas Instruments

2.7 V High-Slew-Rate Rail-to-Rail Output Op Amps

TLV277xĆEP, TLV277xAĆEP FAMILY OF 2.7ĆV HIGHĆSLEWĆRATE RAILĆTOĆRAIL OUTPUT OPERATIONAL AMPLIFIERS WITH SHUTDOWN SGLS317A...



TLV2773-EP

Texas Instruments


Octopart Stock #: O-1494927

Findchips Stock #: 1494927-F

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Description
TLV277xĆEP, TLV277xAĆEP FAMILY OF 2.7ĆV HIGHĆSLEWĆRATE RAILĆTOĆRAIL OUTPUT OPERATIONAL AMPLIFIERS WITH SHUTDOWN SGLS317A − OCTOBER 2005 − REVISED SEPTEMBER 2007 D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree(1) D ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) D High Slew Rate . . . 10.5 V/µs Typ D High-Gain Bandwidth . . . 5.1 MHz Typ D Supply Voltage Range 2.5 V to 5.5 V D Rail-to-Rail Output D 360 µV Input Offset Voltage D Low Distortion Driving 600-Ω 0.005% THD+N D 1 mA Supply Current (Per Channel) D 17 nV/√Hz Input Noise Voltage D 2 pA Input Bias Current D Characterized From TA = −55°C to 125°C D Micropower Shutdown Mode . . . IDD < 1 µA † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. description The TLV277x CMOS operational amplifier family combines high slew rate and bandwidth, ...




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