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FDP4030L

Fairchild Semiconductor

N-Channel MOSFET

March 1998 FDP4030L / FDB4030L N-Channel Logic Level Enhancement Mode Field Effect Transistor General Description Fea...


Fairchild Semiconductor

FDP4030L

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Description
March 1998 FDP4030L / FDB4030L N-Channel Logic Level Enhancement Mode Field Effect Transistor General Description Features These N-Channel enhancement mode power field effect transistors are produced using Fairchild's proprietary, high cell density, DMOS technology. This very high density process has been especially tailored to minimize on-state resistance and provide superior switching performance. These devices are particularly suited for low voltage applications such as DC/DC converters and other battery powered circuits where fast switching, low in-line power loss, and resistance to transients are needed. 20 A, 30 V. RDS(ON) = 0.035 Ω RDS(ON) = 0.055 @ Ω VGS=10 V @ VGS=4.5V. Critical DC electrical parameters specified at elevated temperature. Rugged internal source-drain diode can eliminate the need for an external Zener diode transient suppressor. High density cell design for extremely low RDS(ON). 175°C maximum junction temperature rating. _______________________________________________________________________________ D G S Absolute Maximum Ratings TC = 25°C unless otherwise noted Symbol Parameter FDP4030L VDSS Drain-Source Voltage VGSS Gate-Source Voltage ID Drain Current - Continuous (Note 1) - Pulsed (Note 1) PD Total Power Dissipation @ TC = 25°C Derate above 25°C TJ,TSTG Operating and Storage Temperature Range TL Maximum lead temperature for soldering purposes, 1/8" from case for 5 seconds THERMAL CHARACTERISTICS RθJC Thermal Resistance...




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