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54F219 Dataheets PDF



Part Number 54F219
Manufacturers National Semiconductor
Logo National Semiconductor
Description 64-Bit Random Access Memory
Datasheet 54F219 Datasheet54F219 Datasheet (PDF)

Obsolete 54F 74F219 64-Bit Random Access Memory with TRI-STATE Outputs November 1994 54F 74F219 64-Bit Random Access Memory with TRI-STATE Outputs General Description The ’F219 is a high-speed 64-bit RAM organized as a 16-word by 4-bit array Address inputs are buffered to minimize loading and are fully decoded on-chip The outputs are TRI-STATE and are in the high-impedance state whenever the Chip Select (CS) input is HIGH The outputs are active only in the Read mode This device is similar to.

  54F219   54F219


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Obsolete 54F 74F219 64-Bit Random Access Memory with TRI-STATE Outputs November 1994 54F 74F219 64-Bit Random Access Memory with TRI-STATE Outputs General Description The ’F219 is a high-speed 64-bit RAM organized as a 16-word by 4-bit array Address inputs are buffered to minimize loading and are fully decoded on-chip The outputs are TRI-STATE and are in the high-impedance state whenever the Chip Select (CS) input is HIGH The outputs are active only in the Read mode This device is similar to the ’F189 but features non-inverting rather than inverting data outputs Features Y TRI-STATE outputs for data bus applications Y Buffered inputs minimize loading Y Address decoding on-chip Y Diode clamped inputs minimize ringing Y Available in SOIC (300 mil only) Commercial 74F219PC 74F219SC (Note 1) 74F219SJ (Note 1) Military 54F219DL (Note 2) 54F219FL (Note 2) 54F219LL (Note 2) Package Number N16E J16A M16B M16D W16A E20A Package Description 16-Lead (0 300 Wide) Molded Dual-In-Line 16-Lead Ceramic Dual-In-Line 16-Lead (0 300 Wide) Molded Small Outline JEDEC 16-Lead (0 300 Wide) Molded Small Outline EIAJ 16-Lead Cerpack 20-Lead Ceramic Leadless Chip Carrier Type C Note 1 Devices also available in 13 reel Use suffix e SCX and SJX Note 2 Military grade device with environmental and burn-in processing Use suffix e DLQB FLQB and LLQB Logic Symbol Connection Diagrams Pin Assignment for DIP SOIC and Flatpak Pin Assignment for LCC TL F 9500–1 TL F 9500 – 2 TRI-STATE is a registered trademark of National Semiconductor Corporation C1995 National Semiconductor Corporation TL F 9500 TL F 9500 – 3 RRD-B30M105 Printed in U S A Obsolete Unit Loading Fan Out Pin Names Description A0 – A3 CS WE D0 – D3 O0 – O3 Address Inputs Chip Select Input (Active LOW) Write Enable Input (Active LOW) Data Inputs TRI-STATE Data Outputs 54F 74F UL HIGH LOW 10 10 10 20 10 10 10 10 150 40 (33 3) Input IIH IIL Output IOH IOL 20 mA b0 6 mA 20 mA b1 2 mA 20 mA b0 6 mA 20 mA b0 6 mA b3 mA 24 mA (20 mA) Function Table Inputs CS WE Operation LL LH HX Write Read Inhibit H e HIGH Voltage Level L e LOW Voltage Level X e Immaterial Condition of Outputs High Impedance True Stored Data High Impedance Block Diagram TL F 9500 – 4 2 Obsolete Absolute Maximum Ratings (Note 1) If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications Storage Temperature b65 C to a150 C Ambient Temperature under Bias b55 C to a125 C Junction Temperature under Bias Plastic b55 C to a175 C b55 C to a150 C VCC Pin Potential to Ground Pin b0 5V to a7 0V Input Voltage (Note 2) b0 5V to a7 0V Input Current (Note 2) b30 mA to a5 0 mA Voltage Applied to Output in HIGH State (with VCC e 0V) Standard Output TRI-STATE Output b0 5V to VCC b0 5V to a5 5V Current Applied to Output in LOW State (Max) twice the rated IOL (mA) Note 1 Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired Functional operation under these conditions is not implied Note 2 Either voltage limit or current limit is sufficient to protect inputs Recommended Operating Conditions Free Air Ambient Temperature Military Commercial b55 C to a100 C 0 C to a70 C Supply Voltage Military Commercial a4 5V to a5 5V a4 5V to a5 5V DC Electrical Characteristics Symbol Parameter VIH VIL VCD VOH VOL IIH IBVI ICEX VID IOD IIL IOZH IOZL IOS IZZ ICC Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Current 54F 10% VCC 54F 10% VCC 74F 10% VCC 74F 10% VCC 74F 5% VCC 74F 5% VCC 54F 10% VCC 74F 10% VCC 54F 74F Input HIGH Current 54F Breakdown Test 74F Output HIGH Leakage Current 54F 74F Input Leakage Test 74F Output Leakage Circuit Current 74F Input LOW Current Output Leakage Current Output Leakage Current Output Short-Circuit Current Bus Drainage Test Power Supply Current 54F 74F Min Typ Max 20 08 b1 2 25 24 25 24 27 27 05 05 20 0 50 100 70 250 50 4 75 3 75 b0 6 b1 2 50 b50 b60 b150 500 37 55 Units V V V V V mA mA mA V mA mA mA mA mA mA mA VCC Min Min Min Max Max Max 00 00 Max Max Max Max 0 0V Max Conditions Recognized as a HIGH Signal Recognized as a LOW Signal IIN e b18 mA IOH e b1 mA IOH e b3 mA IOH e b1 mA IOH e b3 mA IOH e b1 mA IOH e b3 mA IOL e 20 mA IOL e 24 mA VIN e 2 7V VIN e 7 0V VOUT e VCC IID e 1 9 mA All Other Pins Grounded VIOD e 150 mV All Other Pins Grounded VIN e 0 5V (An WE Dn) VIN e 0 5V (CS) VOUT e 2 7V VOUT e 0 5V VOUT e 0V VOUT e 5 25V 3 Obsolete AC Electrical Characteristics Symbol Parameter tPLH tPHL tPZH tPZL tPHZ tPLZ tPZH tPZL tPHZ tPLZ Access Time HIGH or LOW An to On Access Time HIGH or LOW CS to On Disable Time HIGH or LOW CS to On Write Recovery Time HIGH or LOW WE to On Disable Time HIGH or LOW WE to On 74F TA e a25 C VCC e a5 0V CL e 50 pF Min Typ Max 10 0 18 5 26 0 8 0 13 5 19 0 35 60 85 5 0 9 0.


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