TOSHIBA Diode Silicon Epitaxial Schottky Barrier Type
1SS385FV
1SS385FV
High-Speed Switching Applications
z Low forwar...
TOSHIBA Diode Silicon Epitaxial
Schottky Barrier Type
1SS385FV
1SS385FV
High-Speed Switching Applications
z Low forward voltage: VF = 0.23 V (typ.) @IF = 5 mA z Ultra-small package
Absolute Maximum Ratings (Ta = 25°C)
0.22±0.05
Unit: mm
1.2±0.05 0.8±0.05
1 23
0.32±0.05
1.2±0.05 0.8±0.05 0.4 0.4
Characteristic
Symbol
Rating
Unit
0.13±0.05
Maximum (peak) reverse voltage
VRM
15 V
0.5±0.05
Reverse voltage
VR 10 V
Maximum (peak) forward current
IFM
200 *
mA
Average forward current Surge current (10 ms) Power dissipation Junction temperature
IO IFSM
P Tj
100 * 1*
150** 125
mA A mW °C
VESM
1. ANODE 1 2. ANODE 2 3. CATHODE
Storage temperature range
Tstg
−55 to 125
°C
Operating temperature range
Topr −40 to 100 °C JEDEC
―
Note: Using continuously under heavy loads (e.g. the application of high JEITA
―
temperature/current/voltage and the significant change in
TOSHIBA
1-1Q1A
temperature, etc.) may cause this product to decrease in the
reliability significantly even if the operating conditions (i.e. operating
temperature/current/voltage, etc.) are within the absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
*: Unit rating. Total rating = unit rating × 1.5
** : Mounted on an FR4 board (25.4 mm × 25.4 mm × 1.6 mmt)
...