1:16 Demux. VSC8162 Datasheet

VSC8162 Demux. Datasheet pdf. Equivalent

Part VSC8162
Description 2.488 Gbit/sec SONET/SDH 1:16 Demux
Feature VITESSE SEMICONDUCTOR CORPORATION Advance Product Information VSC8162 2.488 Gbit/sec SONET/SDH 1:1.
Manufacture Vitesse Semiconductor
Datasheet
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VSC8162
VITESSE
SEMICONDUCTOR CORPORATION
Advance Product Information
VSC8162
2.488 Gbit/sec SONET/SDH
1:16 Demux with Clock Recovery
Features
• 2.488Gb/s 1:16 Demux with Integrated Clock and
Data Recovery
• Recovered Clock and Data Available
• Monolithic Phase Locked Loop
• Digitally Adjustable Serial Data Sampling Point
• Differential Low Speed Outputs
• Differential/Single-ended Reference Clock
• Loss of Lock Detection
• Meets SONET OC-48 and SDH STM-16 Jitter
Tolerance Requirements
General Description
The VSC8162 combines a clock recovery unit (CRU) with a 1:16 demultiplexer on a single chip to directly
generate 16-bit wide data from an incoming 2.488Gb/s NRZ data stream. An on-chip Phase Locked Loop (PLL)
generates a 2.488GHz clock which remains phase locked to the incoming data. The incoming data is retimed
and demultiplexed to a 16-bit word. A Loss of Lock (LOL) signal indicates gross conditions where incoming
data no longer has sufficient transitions to keep the CRU in lock.
VSC8162 Functional Block DIagram
DINVERT
DI+
DI–
REFCK+
REFCK–
PADJ[4:0]
5
Data
Retime
Clock
Recovery
Divide
by 16
RTDO+
RTDO–
D0+
D0–
D15+
D15–
PARITY+
PARITY–
CLK16+
CLK16–
CLKO+
CLKO–
LOL
NOREF
G52209-0, Rev. 2.0
9/14/98
© VITESSE SEMICONDUCTOR CORPORATION
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
Page 1



VSC8162
VITESSE
SEMICONDUCTOR CORPORATION
2.488 Gbit/sec SONET/SDH
1:16 Demux with Clock Recovery
Advance Product Information
VSC8162
Functional Description
Clock Recovery:
The clock recovery unit (CRU) consists of a phase detector, voltage controlled oscillator (VCO), loop filter
and frequency control unit (FCU). The components of the CRU are fully integrated on the VSC8162. A
19.44MHz reference clock (REFCLK) is required for proper operation of the Clock Recovery Unit (CRU). Jit-
ter tolerance of the CRU is well above the SONET and SDH jitter tolerance masks. In addition, the recovered
high speed clock is output on the CLKO pins.
Incoming data is presented to both the clock recovery circuit and the data retiming circuit. When the CRU is
in lock mode, a phase detector circuit is effective. When there is a phase error between the incoming data and
the on-chip VCO, the phase detector output raises or lowers the voltage on the loop filter to null the phase dif-
ference.
The frequency control unit (FCU) monitors the frequency difference between the reference clock, REFCK,
and the recovered clock. At the time that the VCO frequency, fVCO, and the 128x REFCK frequency, 128 x fREF,
differ by less than 1 MHz, the FCU only passively monitors the frequency difference continuously without
sending any corrections to the loop filter. In the event of the loss of an input signal, or if the input is switching
randomly, the VCO will drift in one direction. At the time that fVCO and 128 x fREF differ by more than 1 MHz,
the FCU will maintain the VCO frequency to be at approximately 1MHz off the frequency of 128 x fREF, and the
lock detector will assert the LOL output. LOL is designed to be asserted from between 2.3us and 100us after the
interruption of data.
When NRZ data is again presented at the data input, the phase detector will permit the VCO to lock to the
incoming data. Hysteresis is provided which delays the deassertion of LOL until approximately 160us follow-
ing the restoration of valid data.
The NOREF output will go high to indicate that there is no signal on the REFCK input, or that the REFCK
is more than approximately 25% above or below the expected value.
Retiming:
The retiming decision circuit functions as a D Flip Flop. The recovered clock nominally clocks the decision
circuit in the center of the data eye. Internally, the recovered clock is duplicated to create 32 copies, with a phase
difference between each of 1/32 of a unit interval. The PADJ[4:0] inputs select which of the 32 phases are to be
used to retime the data. Certain lightwave systems employing optical amplifiers suffer from noise in the leading
edge of the data eye. Therefore these systems may achieve their lowest Bit Error Rate (BER) by delaying the
retiming point until later in the eye. The PADJ inputs can be strapped to generate a fixed delay or the customer
can develop a dynamic circuit which can select the optimum retiming point during a training sequence. The
retimed high speed data can be monitored using the RTDO pins.
Figure 1 and Table 1 indicate how the PADJ pins adjust the sampling point in the data eye. The step size of
each unit interval is approximately 12.5ps. The values in Table 1 are not exact and should be used only as an
approximation of the expected delay. Due to environmental variations, the actual measured value at any point
could vary by as much as +/- 1 step size. It should be noted that PADJ[4:0] = ‘00000’ always corresponds to the
sampling center point and that the delay between unit intervals increases monotonically.
Page 2
© VITESSE SEMICONDUCTOR CORPORATION
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
G52209-0, Rev. 2.0
9/14/98





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