DatasheetsPDF.com

CAT25C08 Dataheets PDF



Part Number CAT25C08
Manufacturers Catalyst Semiconductor
Logo Catalyst Semiconductor
Description 1K/2K/4K/8K/16K SPI Serial CMOS E2PROM
Datasheet CAT25C08 DatasheetCAT25C08 Datasheet (PDF)

Advanced Information CAT25C01/02/04/08/16 1K/2K/4K/8K/16K SPI Serial CMOS E2PROM FEATURES s 10 MHz SPI Compatible s 1.8 to 6.0 Volt Operation s Hardware and Software Protection s Zero Standby Current s Low Power CMOS Technology s SPI Modes (0,0 & 1,1) s Commercial, Industrial and Automotive s 1,000,000 Program/Erase Cycles s 100 Year Data Retention s Self-Timed Write Cycle s 8-Pin DIP/SOIC, 8/14-Pin TSSOP and 8-Pin MSOP s 16/32-Byte Page Write Buffer s Block Write Protection – Protect 1/4, 1/2.

  CAT25C08   CAT25C08


Document
Advanced Information CAT25C01/02/04/08/16 1K/2K/4K/8K/16K SPI Serial CMOS E2PROM FEATURES s 10 MHz SPI Compatible s 1.8 to 6.0 Volt Operation s Hardware and Software Protection s Zero Standby Current s Low Power CMOS Technology s SPI Modes (0,0 & 1,1) s Commercial, Industrial and Automotive s 1,000,000 Program/Erase Cycles s 100 Year Data Retention s Self-Timed Write Cycle s 8-Pin DIP/SOIC, 8/14-Pin TSSOP and 8-Pin MSOP s 16/32-Byte Page Write Buffer s Block Write Protection – Protect 1/4, 1/2 or all of E2PROM Array Temperature Ranges DESCRIPTION The CAT25C01/02/04/08/16 is a 1K/2K/4K/8K/16K Bit SPI Serial CMOS E2PROM internally organized as 128x8/256x8/512x8/1024x8/2048x8 bits. Catalyst’s advanced CMOS Technology substantially reduces device power requirements. The CAT25C01/02/04 features a 16-byte page write buffer. The 25C08/16 features a 32-byte page write buffer.The device operates via the SPI bus serial interface and is enabled though a Chip Select (CS). In addition to the Chip Select, the clock input (SCK), data in (SI) and data out (SO) are required to access the device. The HOLD pin may be used to suspend any serial communication without resetting the serial sequence. The CAT25C01/02/04/08/16 is designed with software and hardware write protection features including Block Write protection. The device is available in 8-pin DIP, 8-pin SOIC, 8-pin MSOP and 8/ 14-pin TSSOP packages. PIN CONFIGURATION TSSOP Package (U14) CS SO NC NC NC WP VSS SOIC Package (S) CS SO WP VSS 1 2 3 4 8 7 6 5 VCC HOLD SCK SI DIP Package (P) CS SO WP VSS 1 2 3 4 8 7 6 5 VCC HOLD SCK SI CS SO WP VSS TSSOP Package (U) 1 2 3 4 8 7 6 5 VCC HOLD SCL SI 1 2 3 4 5 6 7 14 13 12 11 10 9 8 VCC HOLD NC NC NC SCK SI MSOP Package (R)* CS SO WP VSS BLOCK DIAGRAM SENSE AMPS SHIFT REGISTERS 1 2 3 4 8 7 6 5 VCC HOLD SCK SI *CAT 25C01/02 only WORD ADDRESS BUFFERS COLUMN DECODERS PIN FUNCTIONS Pin Name SO SCK WP VCC VSS CS SI HOLD NC Function Serial Data Output Serial Clock Write Protect +1.8V to +6.0V Power Supply Ground Chip Select Serial Data Input Suspends Serial Input No Connect SO SI CS WP HOLD SCK I/O CONTROL SPI CONTROL LOGIC BLOCK PROTECT LOGIC CONTROL LOGIC XDEC E2PROM ARRAY DATA IN STORAGE HIGH VOLTAGE/ TIMING CONTROL STATUS REGISTER 25C128 F02 © 1999 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice 1 Doc. No. 25067-00 5/00 CAT25C01/02/04/08/16 Advanced Information ABSOLUTE MAXIMUM RATINGS* Temperature Under Bias ................. –55°C to +125°C Storage Temperature ....................... –65°C to +150°C Voltage on any Pin with Respect to VSS(1) .................. –2.0V to +VCC +2.0V VCC with Respect to VSS ................................ –2.0V to +7.0V Package Power Dissipation Capability (Ta = 25°C) ................................... 1.0W Lead Soldering Temperature (10 secs) ............ 300°C Output Short Circuit Current(2) ........................ 100 mA RELIABILITY CHARACTERISTICS Symbol NEND (3) *COMMENT Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability. Parameter Endurance Data Retention ESD Susceptibility Latch-Up Min. 1,000,000 100 2000 100 Max. Units Cycles/Byte Years Volts mA Reference Test Method MIL-STD-883, Test Method 1033 MIL-STD-883, Test Method 1008 MIL-STD-883, Test Method 3015 JEDEC Standard 17 TDR(3) VZAP(3) ILTH(3)(4) D.C. OPERATING CHARACTERISTICS VCC = +1.8V to +6.0V, unless otherwise specified. Limits Symbol ICC1 ICC2 ISB ILI ILO VIL(3) VIH(3) VOL1 VOH1 VOL2 VOH2 Parameter Power Supply Current (Operating Write) Power Supply Current (Operating Read) Power Supply Current (Standby) Input Leakage Current Output Leakage Current Input Low Voltage Input High Voltage Output Low Voltage Output High Voltage Output Low Voltage Output High Voltage VCC-0.2 VCC - 0.8 0.2 -1 VCC x 0.7 Min. Typ. Max. 5 3 0 2 3 VCC x 0.3 VCC + 0.5 0.4 Units mA mA µA µA µA V V V V V V 4.5V≤VCC<5.5V IOL = 3.0mA IOH = -1.6mA 1.8V≤VCC<2.7V IOL = 150µA IOH = -100µA VOUT = 0V to VCC, CS = 0V Test Conditions VCC = 5V @ 5MHz SO=open; CS=Vss VCC = 5.5V FCLK = 5MHz CS = VCC VIN = VSS or VCC Note: (1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC voltage on output pins is VCC +0.5V, which may overshoot to VCC +2.0V for periods of less than 20 ns. (2) Output shorted for no more than one second. No more than one output shorted at a time. (3) This parameter is tested initially and after a design or process change that affects the parameter. (4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V. D.


CAT25C05 CAT25C08 CAT25C08X


@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site.
(Privacy Policy & Contact)