Document
CAT524
Configured Digitally Programmable Potentiometer (DPP™): Programmable Voltage Applications
FEATURES
s Four 8-bit DPPs configured as programmable
APPLICATIONS
s Automated product calibration s Remote control adjustment of equipment s Offset, gain and zero adjustments in
voltage sources in DAC-like applications
s Common reference inputs s Buffered wiper outputs s Non-volatile NVRAM memory wiper storage s Output voltage range includes both supply rails s 4 independently addressable buffered
self-calibrating and adaptive control systems
s Tamper-proof calibrations s DAC (with memory) substitute
output wipers
s 1 LSB accuracy, high resolution s Serial µP interface s Single supply operation: 2.7V-5.5V s Setting read-back without effecting outputs
DESCRIPTION The CAT524 is a quad, 8-bit digitally-programmable potentiometer (DPP™) configured for programmable voltage and DAC-like applications. Intended for final calibration of products such as camcorders, fax machines and cellular telephones on automated high volume production lines, it is also well suited for self-calibrating systems and for applications where equipment which requires periodic adjustment is either difficult to access or in a hazardous environment. The four independently programmable DPPs have an output range which includes both supply rails. The wipers are buffered by rail to rail op amps. Wiper settings, stored in non-volatile NVRAM memory, are not lost when the device is powered down and are automatically reinstated when power is returned. Each wiper can be dithered to test new output values without effecting FUNCTIONAL DIAGRAM
RDY/BSY V DD 1 V H REF 14 3
the stored settings, and stored settings can be read back without disturbing the DPP’s output. The CAT524 is controlled with a simple 3 wire serial interface. A Chip Select pin allows several devices to share a common serial interface. Communication back to the host controller is via a single serial data line thanks to the Tri-Stated CAT524 Data Output pin. A RDY/BSY output working in concert with an internal low voltage detector signals proper operation of the non-volatile NVRAM memory Erase/Write cycle. The CAT524 is available in the 0 to 70° C commercial and –40° C to 85° C industrial operating temperature ranges. Both 14-pin plastic DIP and SOIC packages are offered.
PIN CONFIGURATION
DIP Package (P) SOIC Package (J)
VDD CLK RDY/BSY CS DI DO PROG 1 2 3 14 13 VREFH VOUT1 VOUT 2 VOUT 3 VOUT 4 VREF L GND
PROG
7
PROGRAM CONTROL
+
–
13
V 1 OUT
VDD CLK RDY/BSY CS DI DO PROG
1 2 3
14 13
VREFH VOUT1 VOUT2 VOUT3 VOUT 4 VREF L GND
DI
5
+
–
12
VOUT2
CLK
2
SERIAL CONTROL
NVRAM
+
11
CS
4
–
V 3 OUT
12 CAT 4 11 524 5 10 6 9 7 8
12 4 CAT 11 524 5 10 6 9 7 8
+
–
10
VOUT4
SERIAL DATA OUTPUT REGISTER
6 DO
CAT524
8 GND 9 V L REF
© 2001 by Catalyst Semiconductor, Inc. Characteristics subject to change without notice
1
Doc. No. 25076-00 4/01 M-1
CAT524
ABSOLUTE MAXIMUM RATINGS* Supply Voltage VDD to GND ...................................... –0.5V to +7V Inputs CLK to GND ............................ –0.5V to VDD +0.5V CS to GND .............................. –0.5V to VDD +0.5V DI to GND ............................... –0.5V to VDD +0.5V PROG to GND ........................ –0.5V to VDD +0.5V VREFH to GND ........................ –0.5V to VDD +0.5V VREFL to GND ......................... –0.5V to VDD +0.5V Outputs D0 to GND ............................... –0.5V to VDD +0.5V VOUT 1– 4 to GND ................... –0.5V to VDD +0.5V Operating Ambient Temperature Commercial (‘C’ or Blank suffix) ...... 0°C to +70°C Industrial (‘I’ suffix) ...................... – 40°C to +85°C RELIABILITY CHARACTERISTICS Symbol
VZAP(1) ILTH(1)(2)
Junction Temperature ..................................... +150°C Storage Temperature ....................... –65°C to +150°C Lead Soldering (10 sec max) .......................... +300°C
* Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Absolute Maximum Ratings are limited values applied individually while other parameters are within specified operating conditions, and functional operation at any of these conditions is NOT implied. Device performance and reliability may be impaired by exposure to absolute rating conditions for extended periods of time.
Parameter
ESD Susceptibility Latch-Up
Min
2000 100
Max
Units
Volts mA
Test Method
MIL-STD-883, Test Method 3015 JEDEC Standard 17
NOTES: 1. This parameter is tested initially and after a design or process change that affects the parameter. 2. Latch-up protection is provided for stresses up to 100mA on address and data pins from –1V to VCC + 1V.
DC ELECTRICAL CHARACTERISTICS: VDD = +2.7 to +5.5V, VREFH = VDD, VREFL = 0V, unless otherwise specified Symbol Accuracy
INL Integral Linearity Error ILOAD = 10 µA ILOAD = 10 µA ILOAD = 40 µA ILOAD = 40 µA ILOAD = 10 µA ILOAD = 10 µA ILOAD = 40 µA ILOAD = 40 µA TR = C TR = I TR = C TR = I TR = C TR.