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BUZ215 Dataheets PDF



Part Number BUZ215
Manufacturers Siemens Semiconductor Group
Logo Siemens Semiconductor Group
Description Power Transistor
Datasheet BUZ215 DatasheetBUZ215 Datasheet (PDF)

BUZ 215 SIPMOS ® Power Transistor • N channel • Enhancement mode • FREDFET Pin 1 G Pin 2 D Pin 3 S Type BUZ 215 VDS 500 V ID 5A RDS(on) 1.5 Ω Package TO-220 AB Ordering Code C67078-A1400-A2 Maximum Ratings Parameter Drain source voltage Drain-gate voltage Symbol Values 500 500 Unit V VDS VDGR ID RGS = 20 kΩ Continuous drain current A 5 TC = 30 °C Pulsed drain current IDpuls 20 TC = 25 °C Gate source voltage Power dissipation VGS Ptot ± 20 75 V W TC = 25 °C Operating tempera.

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BUZ 215 SIPMOS ® Power Transistor • N channel • Enhancement mode • FREDFET Pin 1 G Pin 2 D Pin 3 S Type BUZ 215 VDS 500 V ID 5A RDS(on) 1.5 Ω Package TO-220 AB Ordering Code C67078-A1400-A2 Maximum Ratings Parameter Drain source voltage Drain-gate voltage Symbol Values 500 500 Unit V VDS VDGR ID RGS = 20 kΩ Continuous drain current A 5 TC = 30 °C Pulsed drain current IDpuls 20 TC = 25 °C Gate source voltage Power dissipation VGS Ptot ± 20 75 V W TC = 25 °C Operating temperature Storage temperature Thermal resistance, chip case Thermal resistance, chip to ambient DIN humidity category, DIN 40 040 IEC climatic category, DIN IEC 68-1 Tj Tstg RthJC RthJA -55 ... + 150 -55 ... + 150 ≤ 1.67 75 E 55 / 150 / 56 °C K/W Semiconductor Group 1 07/96 BUZ 215 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Static Characteristics Drain- source breakdown voltage Values typ. max. Unit V(BR)DSS 500 3.5 20 100 10 1.4 4 V VGS = 0 V, ID = 0.25 mA, Tj = 25 °C Gate threshold voltage VGS(th) 2.1 VGS=VDS, ID = 1 mA Zero gate voltage drain current IDSS 250 1000 µA VDS = 500 V, VGS = 0 V, Tj = 25 °C VDS = 500 V, VGS = 0 V, Tj = 125 °C Gate-source leakage current IGSS 100 nA Ω 1.5 VGS = 20 V, VDS = 0 V Drain-Source on-resistance RDS(on) VGS = 10 V, ID = 3.2 A Semiconductor Group 2 07/96 BUZ 215 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Dynamic Characteristics Transconductance Values typ. max. Unit gfs 1.7 2.7 1500 110 40 - S pF 2000 170 70 ns 30 45 VDS≥ 2 * ID * RDS(on)max, ID = 3.2 A Input capacitance Ciss Coss - VGS = 0 V, VDS = 25 V, f = 1 MHz Output capacitance VGS = 0 V, VDS = 25 V, f = 1 MHz Reverse transfer capacitance Crss - VGS = 0 V, VDS = 25 V, f = 1 MHz Turn-on delay time td(on) VDD = 30 V, VGS = 10 V, ID = 2.6 A RGS = 50 Ω Rise time tr 40 60 VDD = 30 V, VGS = 10 V, ID = 2.6 A RGS = 50 Ω Turn-off delay time td(off) 110 140 VDD = 30 V, VGS = 10 V, ID = 2.6 A RGS = 50 Ω Fall time tf 50 65 VDD = 30 V, VGS = 10 V, ID = 2.6 A RGS = 50 Ω Semiconductor Group 3 07/96 BUZ 215 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol min. Reverse Diode Inverse diode continuous forward current IS TC = 25 °C Inverse diode direct current,pulsed A 1.3 180 0.65 5 20 V 1.6 ns 250 µC 1.2 Values typ. max. Unit ISM VSD trr Qrr TC = 25 °C Inverse diode forward voltage VGS = 0 V, IF = 10 A Reverse recovery time VR = 100 V, IF=lS, diF/dt = 100 A/µs Reverse recovery charge VR = 100 V, IF=lS, diF/dt = 100 A/µs Semiconductor Group 4 07/96 BUZ 215 Power dissipation Ptot = ƒ(TC) Drain current ID = ƒ(TC) parameter: VGS ≥ 10 V 5.5 A 80 W Ptot ID 60 4.5 4.0 3.5 3.0 50 40 2.5 30 2.0 1.5 20 1.0 10 0 0 0.5 0.0 20 40 60 80 100 120 °C 160 0 20 40 60 80 100 120 °C 160 TC TC Safe operating area ID = ƒ(VDS) parameter: D = 0.01, TC = 25°C 10 2 Transient thermal impedance Zth JC = ƒ(tp) parameter: D = tp / T 10 1 K/W A ID 10 1 t = 630.0ns p 1 µs ZthJC 10 0 10 µs DS /I D =V 10 -1 100 µs DS (o n) D = 0.50 0.20 0.10 10 0 1 ms R 10 -2 single pulse 0.05 0.02 0.01 10 ms 10 -1 0 10 DC 10 1 10 2 V 10 3 10 -3 -7 10 10 -6 10 -5 10 -4 10 -3 10 -2 10 -1 s 10 0 VDS tp Semiconductor Group 5 07/96 BUZ 215 Typ. output characteristics ID = ƒ(VDS) parameter: tp = 80 µs 12 A 10 Typ. drain-source on-resistance RDS (on) = ƒ(ID) parameter: VGS 5.0 Ptot = 75W l k j i VGS [V] a 4.0 Ω RDS (on) 4.0 3.5 3.0 2.5 a b c d e f ID 9 8 g h b 4.5 c 5.0 d 5.5 e 6.0 f 6.5 7 6 5 4 3 d e f g 7.0 h 7.5 i j 8.0 9.0 g 2.0 h k 10.0 l 20.0 1.5 1.0 0.5 0.0 VGS [V] = a 5.0 4.5 4.0 b 5.5 c 6.0 d 6.5 e f 7.0 7.5 g 8.0 h i j 9.0 10.0 20.0 i j 2 c 1 0 0 ab 4 8 12 16 20 24 28 V 34 0 1 2 3 4 5 6 7 8 A 10 VDS ID Typ. transfer characteristics ID = f (VGS) Typ. forward transconductance gfs = f (ID) parameter: tp = 80 µs VDS≥2 x ID x RDS(on)max 6.0 A 5.0 parameter: tp = 80 µs, VDS≥2 x ID x RDS(on)max 5.0 S ID 4.5 4.0 3.5 3.0 2.5 2.0 gfs 4.0 3.5 3.0 2.5 2.0 1.5 1.5 1.0 1.0 0.5 0.0 0 1 2 3 4 5 6 7 8 V 10 0.5 0.0 0.0 1.0 2.0 3.0 4.0 5.0 VGS A ID 7.0 Semiconductor Group 6 07/96 BUZ 215 Drain-source on-resistance RDS (on) = ƒ(Tj ) parameter: ID = 3.2 A, VGS = 10 V 4.5 Gate threshold voltage VGS (th) = ƒ(Tj) parameter: VGS = VDS, ID = 1 mA 4.6 V 4.0 Ω RDS (on) 3.5 3.0 2.5 2.0 1.5 1.0 98% typ VGS(th) 3.6 3.2 2.8 2.4 2% 98% typ 2.0 1.6 1.2 0.8 0.5 0.0 -60 0.4 0.0 -60 -20 20 60 100 °C 160 -20 20 60 100 °C 160 Tj Tj Typ. capacitances C = f (VDS) parameter:VGS = 0V, f = 1MHz 10 1 Forward characteristics of reverse diode IF = ƒ(VSD) parameter: Tj , tp = 80 µs 10 2 nF C 10 0 A IF Ciss 10 1 10 -1 Coss 10 0 Tj = 25 °C typ Crss Tj = 150 °C typ Tj = 25 °C (98%) Tj = 150 °C (98%) 10 -2 0 10 -1 0.0 5 10 15 20 25 30 V VDS 40 0.4 0.8 1.2 1.6 2.0 2.4 V 3.0 VSD Semiconductor .


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