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UPD78P078Y Dataheets PDF



Part Number UPD78P078Y
Manufacturers NEC
Logo NEC
Description 8 Bit Single-Chip Microcontrollers
Datasheet UPD78P078Y DatasheetUPD78P078Y Datasheet (PDF)

User’s Manual µPD78078, 78078Y Subseries 8-bit Single-chip Microcontrollers µPD78076 µPD78078 µPD78P078 µPD78076Y µPD78078Y µPD78P078Y Document No. U10641EJ4V0UM00 (4th edition) Date Published December 1997 N © 1994 Printed in Japan [MEMO] 2 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of sta.

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Document
User’s Manual µPD78078, 78078Y Subseries 8-bit Single-chip Microcontrollers µPD78076 µPD78078 µPD78P078 µPD78076Y µPD78078Y µPD78P078Y Document No. U10641EJ4V0UM00 (4th edition) Date Published December 1997 N © 1994 Printed in Japan [MEMO] 2 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be gro.


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