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UPD78F9478 Dataheets PDF



Part Number UPD78F9478
Manufacturers NEC
Logo NEC
Description 8 Bit Sigle-Chip Microcontrollers
Datasheet UPD78F9478 DatasheetUPD78F9478 Datasheet (PDF)

User’s Manual µPD789478 Subseries 8-Bit Single-Chip Microcontrollers µPD789477 µPD789478 µPD789479 µPD78F9478 µPD78F9479 Document No. U15400EJ3V0UD00 (3rd edition) Date Published May 2003 N CP(K) Printed in Japan © 2001 [MEMO] 2 User’s Manual U15400EJ3V0UD NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop.

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Document
User’s Manual µPD789478 Subseries 8-Bit Single-Chip Microcontrollers µPD789477 µPD789478 µPD789479 µPD78F9478 µPD78F9479 Document No. U15400EJ3V0UD00 (3rd edition) Date Published May 2003 N CP(K) Printed in Japan © 2001 [MEMO] 2 User’s Manual U15400EJ3V0UD NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The ope.


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