1N5767

PIN Diodes Reliability Data 1N5767 5082-3080 5082-3188 Description For applications requiring component reliability estimation, Hewlett-Packard provides reliability data for all families of devices. Data is initially compiled from reliability tests run prior to market introduction to demon- strate that a product meets design criteria. Additional tests are run periodically. The data on this sheet represents the latest review of accumulated test results. 400 350 300 Applications This information represents the capabilities of the generic device. Failure rates and MTTF values presented here are achievable with normal MIL-S-19500 TX level screening. This reliability screening is no longer available from Hewlett-Packard. The screening tests, references, conditions, lot sizes, and LTPD are provided as references only. 250 200 150 EA = 1.3 eV 100 JUNCTION TEMPERATURE, Tj (°C) 50 25 102 103 104 105 106 107 MEAN TIME TO FAILURE, MTTF (HRS) 108 Mean Time to Failure vs...