Document
High Side Switch with Adjustable Current Limit and Diagnostic Features
NCV47722
The NCV47722 High Side Switch (HSS) with 250 mA is designed for use in harsh automotive environments. The device has a high peak input voltage tolerance and reverse input voltage, reverse bias, overcurrent and overtemperature protections. The integrated current sense feature (adjustable by resistor connected to CSO pin) provides diagnosis and system protection functionality. The CSO pin output current creates voltage drop across CSO resistor which is proportional to output current. Extended diagnostic features in OFF state are also available and controlled by dedicated input and output pins.
Features
• Output Current: up to 250 mA • Enable Input (3.3 V Logic Compatible) • Adjustable Current Limit: up to 350 mA • Protection Features:
♦ Current Limitation ♦ Thermal Shutdown ♦ Reverse Input Voltage and Reverse Bias Voltage
• Diagnostic Features:
♦ Short To Battery (STB) and Open Load (OL) in OFF State ♦ Internal Components for OFF State Diagnostics ♦ Open Collector Flag Output ♦ Output Voltage Monitoring Output (analog)
• AEC−Q100 Grade 1 Qualified and PPAP Capable • These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS
Compliant
Typical Applications
• Audio and Infotainment System • Active Safety System
Cin 1 µF
Diagnostic Enable Input
Vin
Vout
Vout_FB
EN
NCV47722 CSO
CCSO
1 µF DE
EF GND
To A/D R CSO
C out 1 µF
Error Flag Output (Open Collector)
*Vout_FB is sensed Vout output voltage via internal resistor divider
Figure 1. Application Schematic
This document contains information on some products that are still under development. ON Semiconductor reserves the right to change or discontinue these products without notice.
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MARKING DIAGRAM
14 1
14 TSSOP−14 Exposed Pad CASE 948AW
1
NCV4 7722 ALYWG
G
47722 A L Y W G
= Specific Device Code = Assembly Location = Wafer Lot = Year = Work Week = Pb−Free Package
(Note: Microdot may be in either location)
ORDERING INFORMATION
See detailed ordering and shipping information in the package dimensions section on page 10 of this data sheet.
© Semiconductor Components Industries, LLC, 2015
1
July, 2020 − Rev. 1
Publication Order Number: NCV47722/D
NCV47722
IPU 10 mA
IPU_ON
Vin ICSO = Iout / RATIO*
VOLTAGE REFERENCE
RPD_ON
VREF VREF_OFF
PASS DEVICE AND
780k
CURRENT MIRROR
EN
ENABLE
EN
+ VREF 2.55 V
−
SATURATION PROTECTION
THERMAL SHUTDOWN
PD_ON
OC_ON
+ − 0.95x
VREF
Vout CSO
RPD1 500k
STB_OL_OFF
+ RPD2
Vout_FB
100k
EN
IPU_ON
− VREF_OFF
0.5 V
DE RPD_DE
780k
PD_ON
STB_OL_OFF
DIAGNOSTIC CONTROL LOGIC
EF OC_ON
GND
*) for current value of RATIO see into Electrical Characteristic Table Figure 2. Simplified Block Diagram
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NCV47722
1 NC NC NC GND EN CSO Vin
EPAD TSSOP−14 EPAD
14 NC NC NC EF DE Vout_FB Vout
Figure 3. Pin Connections (Top Views)
Table 1. PIN FUNCTION DESCRIPTION
Pin No. TSSOP−14
EPAD
Pin Name
Description
1
NC
Not Connected, not internally bonded.
2
NC
Not Connected, not internally bonded.
3
NC
Not Connected, not internally bonded.
4
GND
Power Supply Ground.
5
EN
Enable Input; low level disables regulator. (Used also for OFF state diagnostics control.
6
CSO
Current Sense Output, Current Limit setting and Output Current value information. See Application Section
for more details.
7
Vin
Power Supply Input.
8
Vout
Regulated Output Voltage.
9
Vout_FB
Output Voltage Analog Monitoring. See Application Section for more details.
10
DE
Diagnostic Enable Input.
11
EF
Error Flag (Open Collector) Output. Active Low.
12
NC
Not Connected, not internally bonded.
13
NC
Not Connected, not internally bonded.
14
NC
Not Connected, not internally bonded.
EPAD
EPAD
Exposed Pad is connected to Ground. Connect to GND plane on PCB.
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NCV47722
Table 2. MAXIMUM RATINGS
Rating
Symbol
Min
Max
Unit
Input Voltage DC
Input Voltage (Note 1) Load Dump − Suppressed
Vin
−42
Us* −
45
V
V 60
Enable Input Voltage
VEN
−42
45
V
Output Voltage Monitoring
Vout_FB
−0.3
10
V
CSO Voltage
VCSO
−0.3
7
V
DE, CS and EF Voltages
VDE, VCS, VEF
−0.3
7
V
Output Voltage
Vout
−1
40
V
Junction Temperature
TJ
−40
150
°C
Storage Temperature
TSTG
−55
150
°C
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. Load Dump Test B (with centralized load dump suppression) according to ISO16750−2 standard. Guaranteed by design. Not tested in
production. Passed Class A according to ISO16750−1.
Table 3. ESD CAPABILITY (Note 2) Rating
Symbol
Min
Max
Unit
ESD Capability, Human Body Model
ESDHBM
−2
2
kV
2. This device series incorporates ESD protection and is tested by the following methods: ESD.