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74LVC1G10

nexperia

Single 3-input NAND gate

74LVC1G10 Single 3-input NAND gate Rev. 7 — 2 February 2022 Product data sheet 1. General description The 74LVC1G10 pr...


nexperia

74LVC1G10

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Description
74LVC1G10 Single 3-input NAND gate Rev. 7 — 2 February 2022 Product data sheet 1. General description The 74LVC1G10 provides a low-power, low-voltage single 3-input NAND gate. The inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of this device in a mixed 3.3 V and 5 V environment. Schmitt trigger action at all inputs makes the circuit tolerant to slower input rise and fall time. This device is fully specified for partial power-down applications using IOFF. The IOFF circuitry disables the output, preventing the damaging backflow current through the device when it is powered down. 2. Features and benefits Wide supply voltage range from 1.65 V to 5.5 V High noise immunity ±24 mA output drive (VCC = 3.0 V) CMOS low power dissipation Latch-up performance exceeds 250 mA Direct interface with TTL levels Inputs accept voltages up to 5 V IOFF circuitry provides partial Power-down mode operation Complies with JEDEC standard: JESD8-7 (1.65 V to 1.95 V) JESD8-5 (2.3 V to 2.7 V) JESD8C (2.7 V to 3.6 V) JESD36 (4.5 V to 5.5 V) ESD protection: HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V CDM JESD22-C101E exceeds 1000 V Multiple package options Specified from -40 °C to +85 °C and -40 °C to +125 °C Nexperia 74LVC1G10 Single 3-input NAND gate 3. Ordering information Table 1. Ordering information Type number Package Temperature range 74LVC1G10GW -40 °C to +125 °C Name TSSOP6 74LVC1G10GV 74LVC1...




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