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74HC03-Q100

nexperia

Quad 2-input NAND gate

74HC03-Q100; 74HCT03-Q100 Quad 2-input NAND gate; open-drain output Rev. 3 — 10 August 2021 Product data sheet 1. Ge...


nexperia

74HC03-Q100

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74HC03-Q100; 74HCT03-Q100 Quad 2-input NAND gate; open-drain output Rev. 3 — 10 August 2021 Product data sheet 1. General description The 74HC03-Q100; 74HCT03-Q100 is a quad 2-input NAND gate with open-drain outputs. Inputs include clamp diodes that enable the use of current limiting resistors to interface inputs to voltages in excess of VCC. This product has been qualified to the Automotive Electronics Council (AEC) standard Q100 (Grade 1) and is suitable for use in automotive applications. 2. Features and benefits Automotive product qualification in accordance with AEC-Q100 (Grade 1) Specified from -40 °C to +85 °C and from -40 °C to +125 °C Wide supply voltage range from 2.0 V to 6.0 V CMOS low power dissipation High noise immunity Latch-up performance exceeds 100 mA per JESD 78 Class II Level B Input levels: For 74HC03-Q100: CMOS level For 74HCT03-Q100: TTL level Complies with JEDEC standards: JESD8C (2.7 V to 3.6 V) JESD7A (2.0 V to 6.0 V) ESD protection: MIL-STD-883, method 3015 exceeds 2000 V HBM JESD22-A114F exceeds 2000 V MM JESD22-A115-A exceeds 200 V (C = 200 pF, R = 0 Ω) 3. Ordering information Table 1. Ordering information Type number Package Temperature range Name 74HC03D-Q100 -40 °C to +125 °C SO14 74HCT03D-Q100 74HC03PW-Q100 -40 °C to +125 °C TSSOP14 74HCT03PW-Q100 Description plastic small outline package; 14 leads; body width 3.9 mm plastic thin shrink small outline package; 14 leads; body width 4.4 mm Version ...




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