3.3-V ABT SCAN TEST DEVICE
SN54LVT18502
3.3-V ABT SCAN TEST DEVICE
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS669 – JULY 1996
D Member of the Texa...
Description
SN54LVT18502
3.3-V ABT SCAN TEST DEVICE
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS669 – JULY 1996
D Member of the Texas Instruments SCOPE ™
Family of Testability Products
D Member of the Texas Instruments
Widebus ™ Family
D State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V VCC)
D Supports Unregulated Battery Operation
Down to 2.7 V
D UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation
From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes
D Packaged in 68-Pin Ceramic Quad Flat (HV)
Packages Using 25-mil Center-to-Center Spacings
HV PACKAGE (TOP VIEW)
1A2 1A1 1OEAB GND 1LEAB 1CLKAB TDO VCC NC TMS 1CLKBA 1LEBA 1OEBA GND 1B1 1B2 1B3
1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 NC VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 10 60 11 59 12 58 13 57 14 56 15 55 16 54 17 53 18 52 19 51 20 50 21 49 22 48 23 47 24 46 25 45 26 44
27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
1B4 1B5 1B6 GND 1B7 1B8 ...
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