TIBPAL22VP10-25M Datasheet PDF Download, etcTI





(PDF) TIBPAL22VP10-25M Datasheet Download

Part Number TIBPAL22VP10-25M
Description HIGH-PERFORMANCE IMPACT-X PROGRAMMABLE ARRAY LOGIC CIRCUIT
Manufacture etcTI
Total Page 24 Pages
PDF Download Download TIBPAL22VP10-25M Datasheet PDF

Features: Obsolete Device TIBPAL22VP10-20C, TIBPAL 22VP10-25M HIGH-PERFORMANCE IMPACT-X PROGRAMMABLE ARRAY LOGIC CIRCUITS SR PS013A − D2943, FEBRUARY 1987 − REV ISED DECEMBER 2010 • Functionally Eq uivalent to the TIBPAL22V10/10A, with A dditional Feedback Paths in the Output Logic Macrocell • Choice of Operating Speeds: TIBPAL22VP10-20C . . . 20 ns M ax TIBPAL22VP10-25M . . . 25 ns Max • Variable Product Term Distribution All ows More Complex Functions to Be Implem ented • Each Output Is User Programma ble for Registered or Combinational Ope ration, Polarity, and Output Enable Con trol • TTL-Level Preload for Improved Testability • Extra Terms Provide Lo gical Synchronous Set and Asynchronous Reset Capability • Fast Programming, High Programming Yield, and Unsurpassed Reliability Ensured Using Ti-W Fuses AC and DC Testing Done at the Factor y Utilizing Special Designed-In Test Fe atures • Dependable Texas Instruments Quality and Reliability • Package Options Include Plastic Dual-In-Line and Chip Carrie.

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Obsolete Device
TIBPAL22VP10-20C, TIBPAL22VP10-25M
HIGH-PERFORMANCE IMPACT-X PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS013A D2943, FEBRUARY 1987 REVISED DECEMBER 2010
Functionally Equivalent to the
TIBPAL22V10/10A, with Additional
Feedback Paths in the Output Logic
Macrocell
Choice of Operating Speeds:
TIBPAL22VP10-20C . . . 20 ns Max
TIBPAL22VP10-25M . . . 25 ns Max
Variable Product Term Distribution
Allows More Complex Functions to Be
Implemented
Each Output Is User Programmable for
Registered or Combinational Operation,
Polarity, and Output Enable Control
TTL-Level Preload for Improved Testability
Extra Terms Provide Logical Synchronous
Set and Asynchronous Reset Capability
Fast Programming, High Programming
Yield, and Unsurpassed Reliability Ensured
Using Ti-W Fuses
AC and DC Testing Done at the Factory
Utilizing Special Designed-In Test Features
Dependable Texas Instruments Quality and
Reliability
Package Options Include Plastic
Dual-In-Line and Chip Carrier Packages
description
C SUFFIX . . . NT PACKAGE
M SUFFIX . . . JT PACKAGE
(TOP VIEW)
CLK/I
I
I
I
I
I
I
I
I
I
I
GND
1
2
3
4
5
6
7
8
9
10
11
12
24 VCC
23 I/O/Q
22 I/O/Q
21 I/O/Q
20 I/O/Q
19 I/O/Q
18 I/O/Q
17 I/O/Q
16 I/O/Q
15 I/O/Q
14 I/O/Q
13 I
C SUFFIX . . . FN PACKAGE
M SUFFIX . . . FK PACKAGE
(TOP VIEW)
I
54
32 1
28 27 26
25
I/O/Q
I6
24 I/O/Q
I7
23 I/O/Q
NC 8
22 NC
I9
21 I/O/Q
I 10
20 I/O/Q
I 11
19 I/O/Q
12 13 14 15 16 17 18
The TIBPAL22VP10’ is equivalent to the
TIBPAL22V10A but offers additional flexibility in
the output structure. The improved output
macrocell uses the registered outputs as inputs
when in a high-impedance condition. This
provides two additional output configurations for a
total of six possible macrocell configurations all of
which are shown in Figure 1.
NC No internal connection
Pin assignments in operating mode
These devices contain up to 22 inputs and 10 outputs. They incorporate the unique capability of defining and
programming the architecture of each output on an individual basis. Outputs may be registered or nonregistered
and inverting or noninverting. In addition, the data may be fed back into the array from either the register or the
I/O port. The ten potential outputs are enabled through the use of individual product terms.
Further advantages can be seen in the introduction of variable product term distribution. This technique
allocates from 8 to 16 logical product terms to each output for an average of 12 product terms per output. This
variable allocation of terms allows far more complex functions to be implemented than in previously available
devices.
IMPACT-X is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 2010, Texas Instruments Incorporated
1

                    
                    






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