SN74HC165-EP

SN74HC165ĆEP 8ĆBIT PARALLELĆLOAD SHIFT REGISTER D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of Up To −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D 2-V to 6-V VCC Operation D Outputs Can Drive Up To 10 LSTTL Loads D Low Power Consumption, 80-µA Max ICC D Typical tpd = 13 ns † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SCLS473A − APRIL 2003 − REVISED JANUARY 2004 D ±4-mA Output Drive at 5 V D Low Input Current of 1 µA Max D Complementary Outputs D Direct Overriding Load (Data) Inputs D Gated Clock Inputs D Parallel-to-Serial Data Conversion D OR PW PACKAGE (TOP VIEW) SH/LD CLK E F G H QH GND 1 2 3 4 5 6 7 8 16 VCC 15 CLK INH 14 D 13 C 12 B 11 A 10 SER 9 QH description/ordering information The SN74HC165 is an 8-bit parallel-load shift register that, when clocked, shifts the data toward a serial (QH) output. Parallel-in access to each stage is provided by eight individual direct data (A−H)...