DatasheetsPDF.com

CD54ACT00 Dataheets PDF



Part Number CD54ACT00
Manufacturers Texas Instruments
Logo Texas Instruments
Description QUADRUPLE 2-INPUT POSITIVE-NAND GATES
Datasheet CD54ACT00 DatasheetCD54ACT00 Datasheet (PDF)

CD54ACT00, CD74ACT00 QUADRUPLE 2-INPUT POSITIVE-NAND GATES D Inputs Are TTL-Voltage Compatible D Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption D Balanced Propagation Delays D ±24-mA Output Drive Current – Fanout to 15 F Devices D SCR-Latchup-Resistant CMOS Process and Circuit Design D Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 SCHS308B – JANUARY 2001 – REVISED JUNE 2002 CD54ACT00 . . . F PACKAGE CD74ACT00 . . . E OR M PACKAGE (TOP VIEW) 1A 1B 1Y 2A .

  CD54ACT00   CD54ACT00


Document
CD54ACT00, CD74ACT00 QUADRUPLE 2-INPUT POSITIVE-NAND GATES D Inputs Are TTL-Voltage Compatible D Speed of Bipolar F, AS, and S, With Significantly Reduced Power Consumption D Balanced Propagation Delays D ±24-mA Output Drive Current – Fanout to 15 F Devices D SCR-Latchup-Resistant CMOS Process and Circuit Design D Exceeds 2-kV ESD Protection Per MIL-STD-883, Method 3015 SCHS308B – JANUARY 2001 – REVISED JUNE 2002 CD54ACT00 . . . F PACKAGE CD74ACT00 . . . E OR M PACKAGE (TOP VIEW) 1A 1B 1Y 2A 2B 2Y GND 1 2 3 4 5 6 7 14 VCC 13 4B 12 4A 11 4Y 10 3B 9 3A 8 3Y description The ‘ACT00 devices contain four independent 2-input NAND gates. Each gate performs the Boolean function of Y = A S B or Y = A + B in positive logic. ORDERING INFORMATION TA PACKAGE† ORDERABLE PART NUMBER TOP-SIDE MARKING PDIP – E Tube CD74ACT00E CD74ACT00E Tube –55°C to 125°C SOIC – M Tape and reel CD74ACT00M CD74ACT00M96 ACT00M CDIP – F Tube CD54ACT00F3A CD54ACT00F3A † Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package. FUNCTION TABLE (each gate) INPUTS AB OUTPUT Y HH L LX H XL H logic diagram, each gate (positive logic) A B Y Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. •POST OFFICE BOX 655303 DALLAS, TEXAS 75265 Copyright  2002, Texas Instruments Incorporated On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. 1 CD54ACT00, CD74ACT00 QUADRUPLE 2-INPUT POSITIVE-NAND GATES SCHS308B – JANUARY 2001 – REVISED JUNE 2002 absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 6 V Input clamp current, IIK (VI < 0 or VI > VCC) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA Output clamp current, IOK (VO < 0 or VO > VCC) (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±50 mA Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±100 mA Package thermal impedance, θJA (see Note 2): E package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 80°C/W M package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 86°C/W Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTES: 1. The input and output voltage ratings may be exceeded if the input and output current ratings are observed. 2. The package thermal impedance is calculated in accordance with JESD 51-7. recommended operating conditions (see Note 3) TA = 25°C MIN MAX –40°C TO 85°C MIN MAX –55°C TO 125°C MIN MAX UNIT VCC VIH VIL VI VO IOH IOL ∆t/∆v Supply voltage High-level input voltage Low-level input voltage Input voltage Output voltage High-level output current Low-level output current Input transition rise or fall rate 4.5 5.5 2 0.8 0 VCC 0 VCC –24 24 10 4.5 5.5 2 0.8 0 VCC 0 VCC –24 24 10 4.5 5.5 V 2V 0.8 V 0 VCC 0 VCC –24 V V mA 24 mA 10 ns/V NOTE 3: All unused inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI application report, Implications of Slow or Floating CMOS Inputs, literature number SCBA004. electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS VCC TA = 25°C MIN MAX –40°C TO 85°C MIN MAX –55°C TO 125°C MIN MAX UNIT IOH = –50 µA 4.5 V 4.4 4.4 4.4 VOH VI = VIH or VIL IOH = –24 mA IOH = –50 mA‡ 4.5 V 5.5 V 3.94 3.8 3.7 3.85 IOH = –75 mA‡ 5.5 V 3.85 V IOL = 50 µA 4.5 V 0.


CD54ACT05 CD54ACT00 CD74ACT00


@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site.
(Privacy Policy & Contact)