SN74AHC244-EP

D Controlled Baseline – One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of –55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D EPIC (Enhanced-Performance Implanted CMOS) Process D Operating Range 2-V to 5.5-V VCC D Latch-Up Performance Exceeds 250 mA Per JESD 17 D ESD Protection Exceeds 1500 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0) † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SN74AHC244-EP OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS SCLS486A – MAY 2003 – REVISED JUNE 2003 DW OR PW PACKAGE (TOP VIEW) 1OE 1A1 2Y4 1A2 2Y3 1A3 2Y2 1A4 2Y1 GND 1 2 3 4 5 6 7 8 9 10 20 VCC 19 2OE 18 1Y1 17 2A4 16 1Y2 15 2A3 14 1Y3 13 2A2 12 1Y4 11 2A1 description/ordering information This octal buffer/driver is designed specifically to improve the performance and density of 3-state memory-address drivers, clock drivers, and bus-oriented receivers and transmitters. The SN74AHC244 is organized as two 4-b...