SN74AHC244-EP OCTAL BUFFER/DRIVER Datasheet

SN74AHC244-EP Datasheet, PDF, Equivalent


Part Number

SN74AHC244-EP

Description

OCTAL BUFFER/DRIVER

Manufacture

etcTI

Total Page 11 Pages
Datasheet
Download SN74AHC244-EP Datasheet


SN74AHC244-EP
D Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
D Extended Temperature Performance of
–55°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree
D EPIC(Enhanced-Performance Implanted
CMOS) Process
D Operating Range 2-V to 5.5-V VCC
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D ESD Protection Exceeds 1500 V Per
MIL-STD-833, Method 3015; Exceeds 150 V
Using Machine Model (C = 200 pF, R = 0)
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SN74AHC244-EP
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCLS486A – MAY 2003 – REVISED JUNE 2003
DW OR PW PACKAGE
(TOP VIEW)
1OE
1A1
2Y4
1A2
2Y3
1A3
2Y2
1A4
2Y1
GND
1
2
3
4
5
6
7
8
9
10
20 VCC
19 2OE
18 1Y1
17 2A4
16 1Y2
15 2A3
14 1Y3
13 2A2
12 1Y4
11 2A1
description/ordering information
This octal buffer/driver is designed specifically to improve the performance and density of 3-state
memory-address drivers, clock drivers, and bus-oriented receivers and transmitters.
The SN74AHC244 is organized as two 4-bit buffers/line drivers with separate output-enable (OE) inputs. When
OE is low, the device passes data from the A inputs to the Y outputs. When OE is high, the outputs are in the
high-impedance state.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
–55°C to 125°C
SOIC – D
Tape and reel
TSSOP – PW Tape and reel
SN74AHC244MDWREP
SN74AHC244MPWREP
AHC244MEP
AHC244EP
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 2003, Texas Instruments Incorporated
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
1

SN74AHC244-EP
SN74AHC244-EP
OCTAL BUFFER/DRIVER
WITH 3-STATE OUTPUTS
SCLS486A MAY 2003 REVISED JUNE 2003
logic symbol
FUNCTION TABLE
(each 4-bit buffer/driver)
INPUTS
OE A
OUTPUT
Y
LH
H
LL
L
HX
Z
1
1OE
EN
19
2OE
2
1A1
4
1A2
6
1A3
8
1A4
18
1Y1
16
1Y2
14
1Y3
12
1Y4
11
2A1
13
2A2
15
2A3
17
2A4
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
1OE 1
2OE 19
2
1A1
18 1Y1
11
2A1
4
1A2
16 1Y2
13
2A2
1A3 6
14 1Y3
2A3 15
1A4 8
12 1Y4
2A4 17
EN
9
2Y1
7
2Y2
5
2Y3
3
2Y4
9 2Y1
7 2Y2
5 2Y3
3 2Y4
2 POST OFFICE BOX 655303 DALLAS, TEXAS 75265


Features D Controlled Baseline – One Assembly/T est Site, One Fabrication Site D Extend ed Temperature Performance of –55°C to 125°C D Enhanced Diminishing Manufa cturing Sources (DMS) Support D Enhance d Product-Change Notification D Qualifi cation Pedigree† D EPIC (Enhanced- Performance Implanted CMOS) Process D O perating Range 2-V to 5.5-V VCC D Latch -Up Performance Exceeds 250 mA Per JESD 17 D ESD Protection Exceeds 1500 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0) † Component qualification in accor dance with JEDEC and industry standards to ensure reliable operation over an e xtended temperature range. This include s, but is not limited to, Highly Accele rated Stress Test (HAST) or biased 85/8 5, temperature cycle, autoclave or unbi ased HAST, electromigration, bond inter metallic life, and mold compound life. Such qualification testing should not b e viewed as justifying use of this comp onent beyond specified performance and environmental limits. SN74AHC244-EP.
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