SN74AHC245-EP Transceivers Datasheet

SN74AHC245-EP Datasheet, PDF, Equivalent


Part Number

SN74AHC245-EP

Description

Octal Bus Transceivers

Manufacture

etcTI

Total Page 11 Pages
Datasheet
Download SN74AHC245-EP Datasheet


SN74AHC245-EP
D Controlled Baseline
– One Assembly/Test Site, One Fabrication
Site
D Extended Temperature Performance of
–55°C to 125°C
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification
D Qualification Pedigree
D Operating Range 2-V to 5.5-V VCC
D Latch-Up Performance Exceeds 250 mA Per
JESD 17
D ESD Protection Exceeds 1000 V Per
MIL-STD-833, Method 3015; Exceeds 100 V
Using Machine Model (C = 200 pF, R = 0)
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
SN74AHC245-EP
OCTAL BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCLS487A – MAY 2003 – REVISED JUNE 2003
DW OR PW PACKAGE
(TOP VIEW)
DIR
A1
A2
A3
A4
A5
A6
A7
A8
GND
1
2
3
4
5
6
7
8
9
10
20 VCC
19 OE
18 B1
17 B2
16 B3
15 B4
14 B5
13 B6
12 B7
11 B8
description/ordering information
The SN74AHC245 octal bus transceiver is designed for asynchronous two-way communication between data
buses. The control-function implementation minimizes external timing requirements.
This device allows data transmission from the A bus to the B bus or from the B bus to the A bus, depending on
the logic level at the direction-control (DIR) input. The output-enable (OE) input can be used to disable the
device so that the buses effectively are isolated.
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
–55°C to 125°C
SOIC – DW Tape and reel
TSSOP – PW Tape and reel
SN74AHC245MDWREP
SN74AHC245MPWREP
AHC245MEP
AHC245EP
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright 2003, Texas Instruments Incorporated
1

SN74AHC245-EP
SN74AHC245-EP
OCTAL BUS TRANSCEIVER
WITH 3-STATE OUTPUTS
SCLS487A MAY 2003 REVISED JUNE 2003
FUNCTION TABLE
(each transceiver)
INPUTS
OE DIR
OPERATION
L L B data to A bus
L H A data to B bus
HX
Isolation
logic symbol
19
OE
1
DIR
G3
3 EN1 [BA]
3 EN2 [AB]
2
A1
3
A2
4
A3
5
A4
6
A5
7
A6
8
A7
9
A8
1
2
18
B1
17
B2
16
B3
15
B4
14
B5
13
B6
12
B7
11
B8
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
logic diagram (positive logic)
1
DIR
19
OE
A1 2
18 B1
To Seven Other Channels
2 POST OFFICE BOX 655303 DALLAS, TEXAS 75265


Features D Controlled Baseline – One Assembly/T est Site, One Fabrication Site D Extend ed Temperature Performance of –55°C to 125°C D Enhanced Diminishing Manufa cturing Sources (DMS) Support D Enhance d Product-Change Notification D Qualifi cation Pedigree† D Operating Range 2- V to 5.5-V VCC D Latch-Up Performance E xceeds 250 mA Per JESD 17 D ESD Protect ion Exceeds 1000 V Per MIL-STD-833, Met hod 3015; Exceeds 100 V Using Machine M odel (C = 200 pF, R = 0) † Component qualification in accordance with JEDEC and industry standards to ensure reliab le operation over an extended temperatu re range. This includes, but is not lim ited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cy cle, autoclave or unbiased HAST, electr omigration, bond intermetallic life, an d mold compound life. Such qualificatio n testing should not be viewed as justi fying use of this component beyond spec ified performance and environmental lim its. SN74AHC245-EP OCTAL BUS TRANSCEIVER WITH 3-STATE OUTPUTS SCLS487A –.
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