SN74HC02-EP

SN74HC02ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆNOR GATE D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of Up To −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D 2-V to 6-V VCC Operation † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SCLS478A − APRIL 2003 − REVISED JANUARY 2004 D Outputs Can Drive Up To 10 LSTTL Loads D Low Power Consumption, 20-µA Max ICC D Typical tpd = 8 ns D ±4-mA Output Drive at 5 V D Low Input Current of 1 µA Max D OR PW PACKAGE (TOP VIEW) 1Y 1A 1B 2Y 2A 2B GND 1 2 3 4 5 6 7 14 VCC 13 4Y 12 4B 11 4A 10 3Y 9 3B 8 3A description/ordering information The SN74HC02 contains four independent 2-input NOR gates. It performs the Boolean function Y = A + B or Y = A B in positive logic. ORDERING INFORMATION TA PACKAGE‡ ORDERABLE PART NUMBER TOP-SIDE MARKING −40°C to 125°C TSSOP − PW Tape and reel SN74HC02QPWREP SHC02EP −55°C to 125°C SOIC − D Tape and reel SN74HC02MDREP HC02MEP ...