Dual Buffer and Driver
SN74LVC2G07-EP
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Description
SN74LVC2G07-EP
www.ti.com ....................................................................................................................................................................................................... SCES719 – MAY 2008
DUAL BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS
FEATURES
1
Controlled Baseline
– One Assembly Site
– One Test Site
– One Fabrication Site
Extended Temperature Performance of –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree (1)
Supports 5-V VCC Operation
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
Inputs and Open-Drain Outputs Accept Voltages up to 5.5 V
Max tpd of 5.7 ns at 3.3 V Low Power Consumption, 10 µA Max ICC ±24-mA Output Drive at 3.3 V Typical VOLP (Output Ground Bounce)
<0.8 V at VCC = 3.3 V, TA = 25°C Typical VOHV (Output VOH Undershoot)
>2 V at VCC = 3.3 V, TA = 25°C Ioff Supports Partial-Power-Down Mode
Operation
Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
ESD Prote...
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