universal PLD. ABT22V10A7 Datasheet

ABT22V10A7 PLD. Datasheet pdf. Equivalent

ABT22V10A7 Datasheet
Recommendation ABT22V10A7 Datasheet
Part ABT22V10A7
Description 5V high-speed universal PLD
Feature ABT22V10A7; INTEGRATED CIRCUITS ABT22V10A5, A7 5V high-speed universal PLD device with live insertion capabilit.
Manufacture Philips
Datasheet
Download ABT22V10A7 Datasheet




Philips ABT22V10A7
INTEGRATED CIRCUITS
ABT22V10A5, A7
5V high-speed universal PLD device
with live insertion capability
Product specification
IC13 Data Handbook
1996 Dec 16



Philips ABT22V10A7
Philips Semiconductors
5V high-speed universal PLD device
with live insertion capability
Product specification
ABT22V10A5, A7
DESCRIPTION
The ABT22V10A is a versatile PAL® device fabricated on Philips
BiCMOS process known as QUBiC.
The QUBiC process produces very high speed, 5 volt devices
(5.0ns) which have excellent noise immunity. The ground bounce of
an output held low while the 9 remaining outputs are switching is
less than 1.0V (typical).
The ABT22V10A outputs are designed to support Live
Insertion/Extraction into powered-up systems. The output is
specially designed so that during VCC ramp, the output remains
3-Stated until VCC 2.1V. At that time, the outputs become fully
functional, depending upon device inputs. (See DC Electrical
Characteristics, Symbol IPU/PD, Page 4).
The ABT family of devices have virtually no ground bounce— less
than 1.0 volts VOLP, measured on an unswitched output (9 remaining
outputs switching, each with a 50pF load tied to ground).
The ABT family of devices has been designed with high drive
outputs (48mA sink and 16mA source currents), which allow for
direct connection to a backplane bus. This feature eliminates the
need for additional, standalone bus drivers, which are traditionally
required to boost the drive of a standard 16/–4mA PLDs.
Philips has developed a new means of testing the integrity of fuses,
both blown and intact fuses, which insures that all the fuses have
been correctly programmed and that each and every fuse—whether
“blown” or “intact”—is at the appropriate and optimal fuse resistance.
This dual verify scheme represents a significant improvement over
single reference voltage comparison schemes that have been used
for bipolar devices since the late 1980’s.
The ABT22V10A uses the familiar AND/OR logic array structure,
which allows direct implementation of sum-of-products equations.
This device has a programmable AND array, which drives a fixed
OR array. The OR sum-of-products feeds an “Output Macro Cell”
(OMC) that can be individually configured as a dedicated input, a
combinatorial output, or a registered output with internal feedback.
PIN CONFIGURATIONS
A Package
CLK/
I2 I1 I0 VCCVCC F9 F8
4 3 2 1 28 27 26
I3 5
25 F7
I4 6
24 F6
I5 7
GND 8
23 F5
22 GND
I6 9
21 F4
I7 10
20 F3
I8 11
19 F2
12 13 14 15 16 17 18
I9 I10 GNDGND I11 F0 F1
A = Plastic Leaded Chip Carrier
PIN LABEL DESCRIPTIONS
SYMBOL
FUNCTION
I1 – I11
Dedicated Input
F0 – F9
Macro Cell Input/Output
CLK/I0
Clock Input/Dedicated Input
VCC
GND
Supply Voltage
Ground
SP00367
FEATURES
Fastest 5V 22V10
Low ground bounce (<1.0V typical)
Live insertion/extraction permitted
High output drive capability: 48mA/–16mA
Varied product term distribution with up to 16 product terms per
output for complex functions
Metastable hardened flip-flops
Programmable output polarity
Design support provided for third party CAD development and
programming hardware
Improved fuse verification circuitry increases reliability
ORDERING INFORMATION
DESCRIPTION
28-Pin Plastic Leaded Chip Carrier
ORDER CODE
ABT22V10A5A
ABT22V10A7A
(5ns device)
(7.5ns device)
©PAL is a registered trademark of Advanced Micro Devices, Inc.
1996 Dec 16
2
DRAWING NUMBER
SOT261-3
853–1795 17606



Philips ABT22V10A7
Philips Semiconductors
5V high-speed universal PLD device
with live insertion capability
Product specification
ABT22V10A5, A7
ABSOLUTE MAXIMUM RATINGS1
SYMBOL
PARAMETER
RATINGS
MIN MAX
UNIT
VCC Supply voltage2
–0.5
+7.0
VDC
VIN Input voltage2
–1.2
VCC + 0.5
VDC
VOUT
Output voltage
–0.5
VCC + 0.5
VDC
IIN Input currents
–30 +30 mA
IOUT
Output currents
+100
mA
Tstg Storage temperature range
–65 +150
°C
NOTES:
1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only. Functional operation at
these or any other condition above those indicated in the operational and programming specification of the device is not implied.
2. Except in programming mode.
OPERATING RANGES
SYMBOL
PARAMETER
VCC
Tamb
Supply voltage
Operating free-air temperature
RATINGS
MIN MAX
+4.75
+5.25
0 +75
UNIT
VDC
°C
THERMAL RATINGS
TEMPERATURE
Maximum junction
Maximum ambient
Allowable thermal rise ambient to junction
150°C
75°C
75°C
VOLTAGE WAVEFORM
+3.0V
90%
10%
0V
1.5ns
tR tF
1.5ns
MEASUREMENTS:
All circuit delays are measured at the +1.5V level of
inputs and outputs, unless otherwise specified.
Input Pulses
SP00368
TEST LOAD CIRCUIT
VCC +5V S1
C1 C2
I0
F0
INPUTS
DUT
In Fn
CK OE
GND
NOTE:
C1 and C2 are to bypass VCC to GND.
R1
R2 CL
SP00369
1996 Dec 16
3





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