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MRFE6VP61K25N

NXP

RF Power LDMOS Transistors

Freescale Semiconductor Technical Data Document Number: MRFE6VP61K25N Rev. 2, 4/2015 RF Power LDMOS Transistors High R...


NXP

MRFE6VP61K25N

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Description
Freescale Semiconductor Technical Data Document Number: MRFE6VP61K25N Rev. 2, 4/2015 RF Power LDMOS Transistors High Ruggedness N--Channel Enhancement--Mode Lateral MOSFETs These high ruggedness devices are designed for use in high VSWR industrial, medical, broadcast, aerospace and mobile radio applications. Their unmatched input and output design allows for wide frequency range use from 1.8 to 600 MHz. Typical Performance: VDD = 50 Vdc Frequency (MHz) Signal Type 87.5–108 (1,2) CW 230 (3) Pulse (100 sec, 20% Duty Cycle) Pout (W) 1309 CW 1250 Peak Gps (dB) 24.1 23.0 D (%) 77.6 72.3 Load Mismatch/Ruggedness Frequency (MHz) Signal Type VSWR Pin Test (W) Voltage Result 230 (3) Pulse > 65:1 at all 11.5 Peak 50 No Device (100 sec, 20% Phase Angles (3 dB Degradation Duty Cycle) Overdrive) 1. Measured in 87.5–108 MHz broadband reference circuit. 2. The values shown are the center band performance numbers across the indicated frequency range. 3. Measured in 230 MHz narrowband test circuit. MRFE6VP61K25N MRFE6VP61K25GN 1.8–600 MHz, 1250 W CW, 50 V WIDEBAND RF POWER LDMOS TRANSISTORS OM--1230--4L PLASTIC MRE6VP61K25N OM--1230G--4L PLASTIC MRE6VP61K25GN Features  Unmatched Input and Output Allowing Wide Frequency Range Utilization  Device can be used Single--Ended or in a Push--Pull Configuration  Qualified up to a Maximum of 50 VDD Operation  Characterized from 30 to 50 V for Extended Power Range  Suitable for Linear Application with Appropria...




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