CTD6006-T52 N-Channel Enhancement MOSFET
Features
Drain-Source Breakdown Voltage VDSS 60V Drain-Source On-Resistanc...
CTD6006-T52 N-Channel Enhancement MOSFET
Features
Drain-Source Breakdown Voltage VDSS 60V Drain-Source On-Resistance
RDS(ON) 20m, at VGS= 10V, ID= 20A RDS(ON) 24m, at VGS= 4.5V, ID= 10A
Continuous Drain Current at TC=25℃, ID =35A Advanced high cell density Trench Technology RoHS Compliance & Halogen Free
Description
The CTD6006-T52 is the N-Channel logic enhancement mode power field effect
transistors are produced using high cell density, DMOS trench technology. This high density process is especially tailored to minimize on-state resistance. These devices are particularly suited for low voltage application.
Applications
Super Low Gate Charge 100% EAS Guaranteed Green Device Available Excellent CdV/dt effect decline
Package Outline
Schematic
Drain
Gate
Source
Drain Gate
Source
CT Micro Proprietary & Confidential
Page 1
Rev 1 Jan, 2018
CTD6006-T52 N-Channel Enhancement MOSFET
Absolute Maximum Rating at 25oC
Symbol
Parameters
VDS Drain-Source Voltage
VGS Gate-Source Voltage
ID Continuous Drain Current @TC=25℃
IDM Pulsed Drain Current
PD Total Power Dissipation @TC=25℃
TSTG
Storage Temperature Range
TJ Operating Junction Temperature Range
Thermal Characteristics
Symbol
Parameters
RӨJC
Thermal Resistance Junction-Case
Test Conditions
Test Conditions 60 ±20 35 140 44.6
-55 to 150 -55 to 150
Min Note Vs V A1 A1 W2 °C °C
Min Typ Max Units Notes
--
--
2.8
oC /W
1
CT Micro Proprietary & Confidential
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Rev 1 Jan, 2018
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